456-0305/01 – Computer Diagnostics (DGP)

Gurantor departmentDepartment of Computer ScienceCredits5
Subject guarantorprof. Ing. Karel Vlček, CSc.Subject version guarantorprof. Ing. Karel Vlček, CSc.
Study levelundergraduate or graduateRequirementOptional
Year1Semesterwinter
Study languageCzech
Year of introduction2003/2004Year of cancellation2009/2010
Intended for the facultiesFEIIntended for study typesFollow-up Master
Instruction secured by
LoginNameTuitorTeacher giving lectures
MIL051 Ing. Martin Milata
VLC25 prof. Ing. Karel Vlček, CSc.
Extent of instruction for forms of study
Form of studyWay of compl.Extent
Full-time Credit and Examination 2+2
Part-time Credit and Examination 10+0

Subject aims expressed by acquired skills and competences

Introduction to theoretical, and practical activities in troubleshoot identification and test generation. A frequentant will be familiar in diagnostics, and test programme generation for digital systems. Special interest is streamed to diagnotics of custom circuits, which are designed to be peripheral of computers.

Teaching methods

Lectures
Tutorials
Project work

Summary

The Computer Diagnostics arose from the same moment as the beginning of computer design. The necessity of verification of behavioural of circuits is regular process of design, and manufacturing, fault discovering on the basis of errors found by the test process is the substantial activity in circuit debugging and computer assembling, as well as in services. The testing is the practical application of diagnostics, it is necessary to fault discovering from the errors indicated as the responses of fault circuit. They are not in congruency with the description of technical specification. The increasing circuit complexity of computers causes the necessity to apply the sophisticate methods of testing. Minimisation of the length of test vector sequences, together with clever way of error detection through the test processing are the basic assumptions for effective testing, namely in these cases, if it is used pseudo-random test generation. Application of response compression by the method of signature analysis during the test results evaluation is very carefully worked out test method, which is contained as the part of Boundary-Scan Test methodology defined by IEEE Std 1149.1. The BSDL language does the support of the circuit design. Frequently asked parts of digital systems are tests of memories, they are with respect to more complicate model of failure and with respect to regular structure of memory chip, generated by algorithmic ways. Statistic evaluation of failure occurrence and the effective capture of errors during the tests complete the overview of test methods of semiconductor memories. Specific requirements for test machine construction of memories are introduced in this coherence. The extra chapter is devoted to memory dynamic parameter testing. Briefly introduced are methods of on-line testing with the support of error-control coding of written files in memories.

Compulsory literature:

Novák, O., Gramatova, E., Ubar, R., at al.: Handbook of Testing Electronic Systems, Czech Technical University Publishing House (2005), ISBN 80-01-03318-X Abramovici, M., Breuer, M. A., Friedman, A. D.: Digital systems Testing and Testable Designs. Computer Science Press (1995)

Recommended literature:

Schoen, J. M.: Performance and Fault Modelling with VHDL. Prentice Hall (1992). Adams, R. Dean: High Performance Memory Testing. Design Principles, Fault modelling and Self-Test. Kluwer Academic Publishers, (2003)

Way of continuous check of knowledge in the course of semester

Průběžná kontrola studia: Zpracování semestrálního projektu

E-learning

Other requirements

Prerequisities

Subject has no prerequisities.

Co-requisities

Subject has no co-requisities.

Subject syllabus:

Přednášky: Základní pojmy diagnostiky. Druhy poruch v číslicových systémech. Generování testů pro číslicové obvody. Intuitivní zcitlivění cesty. D-algoritmus: přenos, průnik, konzistence. Booleovské diference. Vestavěné diagnostické prostředky. Hraniční testování - BST (Boundary-Scan Testing). Programovací jazyky pro BST. Zkoušeče, kategorizace na typy, hlavní funkční bloky. Technika hledání poruch. Vestavěné diagnostické prostředky. Testování pamětí - modely poruch. Testování mikroprocesorů. Diagnostika pomocí vývojových systémů. Směry dalšího rozvoje testovací techniky. Cvičení: Ve cvičeních jsou počítány příklady na zjišťování přítomnosti poruch, jsou generovány pseudonáhodné testovací vektory a vyhodnocovány případové studie pro pokrytí testem u různých typů číslicových obvodů a systémů Projekty: Projekt: vytvoření metody testování středně složité jednotky počítače. Počítačové laboratoře: Počítačová cvičení jsou prováděna na počítačové učebně, kde jsou řešeny příklady a spouštěny simulace vybraných experimentů.

Conditions for subject completion

Part-time form (validity from: 1960/1961 Summer semester, validity until: 2007/2008 Summer semester)
Task nameType of taskMax. number of points
(act. for subtasks)
Min. number of pointsMax. počet pokusů
Exercises evaluation and Examination Credit and Examination 100 (145) 51 3
        Examination Examination 100  0 3
        Exercises evaluation Credit 45  0 3
Mandatory attendence participation:

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Conditions for subject completion and attendance at the exercises within ISP:

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Occurrence in study plans

Academic yearProgrammeBranch/spec.Spec.ZaměřeníFormStudy language Tut. centreYearWSType of duty
2009/2010 (N2647) Information and Communication Technology (2612T025) Computer Science and Technology P Czech Ostrava 1 Optional study plan
2009/2010 (N2647) Information and Communication Technology (2612T025) Computer Science and Technology K Czech Ostrava 1 Optional study plan
2008/2009 (N2647) Information and Communication Technology (2612T025) Computer Science and Technology P Czech Ostrava 1 Optional study plan
2008/2009 (N2647) Information and Communication Technology (2612T025) Computer Science and Technology K Czech Ostrava 1 Optional study plan
2008/2009 (N2646) Information Technology (2612T025) Computer Science and Technology K Czech Ostrava 2 Choice-compulsory study plan
2007/2008 (N2646) Information Technology (2612T025) Computer Science and Technology P Czech Ostrava 2 Choice-compulsory study plan
2007/2008 (N2646) Information Technology (2612T025) Computer Science and Technology K Czech Ostrava 2 Choice-compulsory study plan
2007/2008 (N2647) Information and Communication Technology (2612T025) Computer Science and Technology P Czech Ostrava 1 Optional study plan
2007/2008 (N2647) Information and Communication Technology (2612T025) Computer Science and Technology K Czech Ostrava 1 Optional study plan
2006/2007 (N2646) Information Technology (2612T025) Computer Science and Technology P Czech Ostrava 2 Choice-compulsory study plan
2006/2007 (N2646) Information Technology (2612T025) Computer Science and Technology K Czech Ostrava 2 Choice-compulsory study plan
2006/2007 (N2647) Information and Communication Technology (2612T025) Computer Science and Technology P Czech Ostrava 1 Optional study plan
2006/2007 (N2647) Information and Communication Technology (2612T025) Computer Science and Technology K Czech Ostrava 1 Optional study plan
2005/2006 (N2646) Information Technology (2612T025) Computer Science and Technology P Czech Ostrava 2 Choice-compulsory study plan
2005/2006 (N2646) Information Technology (2612T025) Computer Science and Technology K Czech Ostrava 2 Choice-compulsory study plan
2004/2005 (N2646) Information Technology (2612T025) Computer Science and Technology P Czech Ostrava 2 Choice-compulsory study plan
2004/2005 (N2646) Information Technology (2612T025) Computer Science and Technology K Czech Ostrava 2 Choice-compulsory study plan
2003/2004 (N2646) Information Technology (2612T025) Computer Science and Technology P Czech Ostrava 2 Choice-compulsory study plan
2003/2004 (N2646) Information Technology (2612T025) Computer Science and Technology K Czech Ostrava 2 Choice-compulsory study plan

Occurrence in special blocks

Block nameAcademic yearForm of studyStudy language YearWSType of blockBlock owner

Assessment of instruction



2009/2010 Winter