480-4037/01 – Optical and Magnetic Defectoscopy (OMD)

Gurantor departmentDepartment of PhysicsCredits6
Subject guarantordoc. RNDr. Petr Hlubina, CSc.Subject version guarantordoc. RNDr. Petr Hlubina, CSc.
Study levelundergraduate or graduateRequirementChoice-compulsory type A
Study languageCzech
Year of introduction2018/2019Year of cancellation
Intended for the facultiesFEI, USPIntended for study typesFollow-up Master
Instruction secured by
LoginNameTuitorTeacher giving lectures
HLU03 doc. RNDr. Petr Hlubina, CSc.
ZIV01 doc. Ing. Ondřej Životský, Ph.D.
Extent of instruction for forms of study
Form of studyWay of compl.Extent
Full-time Credit and Examination 3+3

Subject aims expressed by acquired skills and competences

To acquaint oneself on a series of laboratory measurments with general approaches of use of optical diagnostics.

Teaching methods

Experimental work in labs


The subject is connected with the student's knowledge of mathematics, physics and materials. The course is built on a series of laboratory measurements and theory to them and develops the knowledge obtained in previous studies.

Compulsory literature:

Engst, P., Horák, M.: Laser Applications (in Czech), SNTL, Prague 1989; Sochor,V.: Lasers and Coherent Beams (in Czech), Academia, Prague 1990; Hariharan, P.: Optical Interferometry, Academic Press, New York 1985.

Recommended literature:

Balaš, J., Szabó,V.: Holographic Interferometry in Experimental Mechanics, Veda, Bratislava 1986. Pluta, M.: Advanced Light Microscopy. PWN, Warszava 1988.

Way of continuous check of knowledge in the course of semester

Elaboration of measurement protocols.


Not available.

Další požadavky na studenta

Systematic work of a student of a Master study is supposed.


Subject has no prerequisities.


Subject has no co-requisities.

Subject syllabus:

1. Defectoscopy of izotropic samples by an interferometric method (dispersion measurement, thickness measurement). 2. Defectoscopy of anizotropic samples by an interferometric method (dispersion measurement, thickness measurement). 3. Defectoscopy of thin films and structures metodou by a reflectometric, polarimetric and interferometric method (thickness measurement, geometry measurement of a structure). 4. Defectoscopy of thin films by a method of optical microscopy. 5. Defectoscopy of optical fibres by methods of optical interferometry. 6. Physical introduction in magnetic defectoscopy. 7. Magnetic defectoscopy of steel ropes and pipes (survey of rope states) by a method of flow dissipation. 8. Magnetic defectoscopy by means of whirling currents.

Conditions for subject completion

Full-time form (validity from: 2018/2019 Winter semester)
Task nameType of taskMax. number of points
(act. for subtasks)
Min. number of points
Credit and Examination Credit and Examination 100 (100) 51
        Credit Credit 40  20
        Examination Examination 60  11
Mandatory attendence parzicipation: Minimum attendance at seminars 75%

Show history

Occurrence in study plans

Academic yearProgrammeField of studySpec.FormStudy language Tut. centreYearWSType of duty
2019/2020 (N0533A110006) Applied Physics P Czech Ostrava 2 Choice-compulsory type A study plan
2019/2020 (N1701) Physics (1702T001) Applied Physics P Czech Ostrava 2 Choice-compulsory study plan
2018/2019 (N1701) Physics (1702T001) Applied Physics P Czech Ostrava 2 Choice-compulsory study plan

Occurrence in special blocks

Block nameAcademic yearForm of studyStudy language YearWSType of blockBlock owner