480-4050/01 – Selected chapters from optical diagnostics (VKOD)
| Gurantor department | Department of Physics | Credits | 5 |
| Subject guarantor | prof. RNDr. Petr Hlubina, CSc. | Subject version guarantor | prof. RNDr. Petr Hlubina, CSc. |
| Study level | undergraduate or graduate | Requirement | Optional |
| Year | 2 | Semester | summer |
| | Study language | Czech |
| Year of introduction | 2022/2023 | Year of cancellation | |
| Intended for the faculties | FEI | Intended for study types | Follow-up Master |
Subject aims expressed by acquired skills and competences
To acquaint oneself with general rules of use of optical radiation in diagnostics with various methods of optical diagnostics with emphasis on refractometry, microscopy, surface topography, length measurement and their changes, and spectroscopy, respectively.
Teaching methods
Lectures
Seminars
Summary
Within this application subject, knowledge of optics will be further developed and deepened with the aim to provide an overview of various methods of optical diagnostics.
Compulsory literature:
Fuka, J., Havelka, B., Optics (in Czech). SPN, Prague, 1961;
Sochor, V.: Lasers and Coherent Beams (in Czech). Academia, Prague 1990;
Halliday, D., Resnick, R., Walker, J.: Fyzika 4. Elektromagnetic Waves – Optics – Relativity (in Czech). Prague: Vutium and Prometheus, 2001.
Recommended literature:
Sequens, J.: Technics of Physical Fields Imaging (in Czech). Academia, Prague, 1980;
Hariharan, P.: Optical Interferometry. Academic Press, New York, 1985;
Yoshizawa, T., edit.: Handbook of Optical Metrology, 2nd Edition, CRC Press, New York 2015.
Way of continuous check of knowledge in the course of semester
Written exams. Ability to independently solve the problems associated with Selected Chapters of Optical Disgnostics
E-learning
Not available.
Other requirements
Systematic work of a student of a Magister study is supposed.
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
1. Measurement of refractive index - refractometry
- refractive index and dispersion, total refractometers, surface waves based refractometers, interference refractometers
2. Optical microscopy
- optical microscope, phase contrast microscope, microscope with a polarized light, confocal microscope, fluorescence microscope
3. Measurement of surface topography
- confocal scanning microscopy, interference microscopy, spectral interferometry
4. Measurement of lengths and their changes, velocimetry
- time-domain interferometry, triangulation, time-of-flight method, spectral interferometry, Doppler anemometry, an interference method of crossed beams
5. Determination of course of physical fields
- interferometry, interferometry with a polarized light (photoelasticimetry), holography
6. Spectroscopy
- prism and grating spectrometers, compact spectrometers, Fourier spectrometers
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction
Předmět neobsahuje žádné hodnocení.