480-6013/01 – Optical Diagnostical Methods (ODM)
Gurantor department | Department of Physics | Credits | 10 |
Subject guarantor | prof. RNDr. Petr Hlubina, CSc. | Subject version guarantor | prof. RNDr. Petr Hlubina, CSc. |
Study level | postgraduate | Requirement | Choice-compulsory type B |
Year | | Semester | winter + summer |
| | Study language | Czech |
Year of introduction | 2018/2019 | Year of cancellation | |
Intended for the faculties | FEI, USP, HGF | Intended for study types | Doctoral |
Subject aims expressed by acquired skills and competences
Collect bases of optical diagnostic methods
Describe, clarify and interpret up-to-date knowledge in this research field
Apply modern approaches in solving the practice problems
Teaching methods
Lectures
Individual consultations
Summary
The subject Optical Diagnostic Methods belongs to the facultative subjects of the doctoral study programme Nanotechnology. Within this subject, students will be systematically introduced to choice diagnostic methods of various waveguiding media and thin-film structures.
Compulsory literature:
1. Hariharan, P.: Optical Interferometry. Academic Press, New York, 1985.
2. Mandel, L. - Wolf, E.: Optical Coherence and Quantum Optics. Cambridge University Press, Cambridge, 1995.
3. Born, M. – Wolf, E.: Principles of Optics. Cambridge University Press, Cambridge, 1998.
4. Snyder, A. – Love, J.: Optical Waveguide Theory. London: Chapman and Hall 1983.
5. Marcuse, D.: Principles of Optical Fibre Measurements, Academic Press, New York 1981.
Recommended literature:
Leach, R.: Optical Measurement of Surface Topography, Springer, Berlin 2011.
Way of continuous check of knowledge in the course of semester
tutorials, oral exam
E-learning
Not available.
Other requirements
Systematic and independent work of a Ph.D. student is supposed.
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
1. Measurement of refractive index of isotropic and anisotropic media
1.1. Refractive index as characteristics of a medium. Phase and group refractive index, chromatic dispersion.
1.2. Kramers-Kroning dispersion relation. Semiempirical dispersion relation (Sellmeier, Cauchy, and so on).
1.3. Methods of measurement of phase and group refractive index. Fraunhoffer method, reflectometric methods, interferometric methods, ellipsometric methods.
1.4. Total refractometers (Abbe), Michelson, Mach-Zehnder and Rayleigh interferometer. Spectral ellipsometer. Fiber refractometers.
2. Measurement of dispersion of photonic crystal fibers
2.1. Material dispersion, vaweguiding and chromatic dispersion. Polarization mode dispersion, phase and group birefringence.
2.2. Theory of propagation of electromagnetic vawes in photonic crystal fibers. Modes and dispersion relation of modes.
2.3. Methods of measurement of dispersion of photonic crystal fibers. Time-domain method (time of flight), phase method, interferometric methods.
2.4. White-light spectral interferometry. Michelson interferometer (measurement of group birefringence). Mach-Zehnder interferometer (measurement of group and chromatic dispersion). Spectral method of measurement of phase birefringence. Polarimetric measurement of phase and group birefringence.
3. Optical reflectometry and ellipsometry
3.1. Fresnel relations. Complex reflection and transmission coefficients. Power reflection and transmission coefficients. Ellipsometric parameters.
3.2. Reflection of electromagnetic vawe from a thin film and multilayered film. Interferometric, reflectometric and ellipsometric determination of thin-film parameters.
3.3. Methods of measurement at normal incidence: spectral interferometry and reflectometry.
3.3. Methods of measurement at oblique incidence: spectral reflectometry and ellipsometry.
3.4. Commercial optical interferometers, reflectometers, ellipsometers.
4. Optical profilometry
4.1. Low-coherence optical profilometry. Spectral profilometry and profilometry with a light source of continuously varied wavelength.
4.2. Commercial optical profilometers.
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction
Předmět neobsahuje žádné hodnocení.