516-0894/01 – Optical Defectoscopy (OD)
| Gurantor department | Institute of Physics | Credits | 4 |
| Subject guarantor | doc. RNDr. Petr Hlubina, CSc. | Subject version guarantor | doc. RNDr. Petr Hlubina, CSc. |
| Study level | undergraduate or graduate | | |
| | Study language | Czech |
| Year of introduction | 2004/2005 | Year of cancellation | 2012/2013 |
| Intended for the faculties | HGF | Intended for study types | Follow-up Master |
Subject aims expressed by acquired skills and competences
To apply knowledge of general principles of optical radiation in measuring defectoscopical methods in different production technologies.
Teaching methods
Summary
The subject is built on a series of laboratory measurements and develops the knowledge gained in previous studies within the subject Optical Diagnostic Methods, and uses a modern instrumentation base of Laboratory of Interferometry and Fibre Optics.
Compulsory literature:
[1] SOCHOR,V. Lasery a koherentní svazky. Academia, Praha, 1990.
[2] JONES, S., R., WYKES, C. Holographic and Speckle Interferometry, Cambridge University Press, Cambridge 1985.
[3] BALAŠ, J., SZABÓ,V. Holografická interferometria v experimentalnej mechanike. Veda, Bratislava, 1986.
[4] PLUTA, M. Advanced Light Microscopy. PWN, Warszava 1988.
[5] ENGST, P., HORÁK, M. Aplikace laserů. SNTL, Praha, 1989.
[6] Články v odborných optických časopisech (např. Jemná mechanika a optika).
Recommended literature:
Way of continuous check of knowledge in the course of semester
E-learning
Další požadavky na studenta
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Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
- Defectoscopy of isotropic samples by a method of interferometry (dispersion and thickness measurement, respectively).
- Defectoscopy of anisotropic samples by a method of interferometry (dispersion and thickness measurement, respectively).
- Defectoscopy of thin films and structures by a method of reflectometry, polarimetry and interferometry (thickness and geometry measurement of a structure, respectively).
- Defectoscopy of thin films by a method of optical microscopy.
- Defectoscopy of optical fibres by methods of optical interferometry.
Conditions for subject completion
Conditions for completion are defined only for particular subject version and form of study
Occurrence in study plans
Occurrence in special blocks