516-0894/01 – Optical Defectoscopy (OD)

Gurantor departmentInstitute of PhysicsCredits4
Subject guarantordoc. RNDr. Petr Hlubina, CSc.Subject version guarantordoc. RNDr. Petr Hlubina, CSc.
Study levelundergraduate or graduate
Study languageCzech
Year of introduction2004/2005Year of cancellation2012/2013
Intended for the facultiesHGFIntended for study typesFollow-up Master
Instruction secured by
LoginNameTuitorTeacher giving lectures
HLU03 doc. RNDr. Petr Hlubina, CSc.
VAL30 doc. Ing. Jan Valíček, Ph.D.
Extent of instruction for forms of study
Form of studyWay of compl.Extent
Full-time Graded credit 0+3

Subject aims expressed by acquired skills and competences

To apply knowledge of general principles of optical radiation in measuring defectoscopical methods in different production technologies.

Teaching methods

Summary

The subject is built on a series of laboratory measurements and develops the knowledge gained in previous studies within the subject Optical Diagnostic Methods, and uses a modern instrumentation base of Laboratory of Interferometry and Fibre Optics.

Compulsory literature:

[1] SOCHOR,V. Lasery a koherentní svazky. Academia, Praha, 1990. [2] JONES, S., R., WYKES, C. Holographic and Speckle Interferometry, Cambridge University Press, Cambridge 1985. [3] BALAŠ, J., SZABÓ,V. Holografická interferometria v experimentalnej mechanike. Veda, Bratislava, 1986. [4] PLUTA, M. Advanced Light Microscopy. PWN, Warszava 1988. [5] ENGST, P., HORÁK, M. Aplikace laserů. SNTL, Praha, 1989. [6] Články v odborných optických časopisech (např. Jemná mechanika a optika).

Recommended literature:

Way of continuous check of knowledge in the course of semester

E-learning

Další požadavky na studenta

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Prerequisities

Subject has no prerequisities.

Co-requisities

Subject has no co-requisities.

Subject syllabus:

- Defectoscopy of isotropic samples by a method of interferometry (dispersion and thickness measurement, respectively). - Defectoscopy of anisotropic samples by a method of interferometry (dispersion and thickness measurement, respectively). - Defectoscopy of thin films and structures by a method of reflectometry, polarimetry and interferometry (thickness and geometry measurement of a structure, respectively). - Defectoscopy of thin films by a method of optical microscopy. - Defectoscopy of optical fibres by methods of optical interferometry.

Conditions for subject completion

Conditions for completion are defined only for particular subject version and form of study

Occurrence in study plans

Academic yearProgrammeField of studySpec.FormStudy language Tut. centreYearWSType of duty
2012/2013 (N2102) Mineral Raw Materials (3911T001) Applied Physics of Materials P Czech Ostrava 2 Choice-compulsory study plan
2011/2012 (N2102) Mineral Raw Materials (3911T001) Applied Physics of Materials P Czech Ostrava 2 Choice-compulsory study plan
2010/2011 (N2102) Mineral Raw Materials (3911T001) Applied Physics of Materials P Czech Ostrava 2 Choice-compulsory study plan
2009/2010 (N2102) Mineral Raw Materials (3911T001) Applied Physics of Materials P Czech Ostrava 2 Choice-compulsory study plan

Occurrence in special blocks

Block nameAcademic yearForm of studyStudy language YearWSType of blockBlock owner