516-0894/01 – Optical Defectoscopy (OD)

Gurantor departmentInstitute of PhysicsCredits4
Subject guarantorprof. RNDr. Petr Hlubina, CSc.Subject version guarantorprof. RNDr. Petr Hlubina, CSc.
Study levelundergraduate or graduateRequirementChoice-compulsory
Year2Semestersummer
Study languageCzech
Year of introduction2004/2005Year of cancellation2012/2013
Intended for the facultiesHGFIntended for study typesFollow-up Master
Instruction secured by
LoginNameTuitorTeacher giving lectures
HLU03 prof. RNDr. Petr Hlubina, CSc.
VAL30 doc. Ing. Jan Valíček, Ph.D.
Extent of instruction for forms of study
Form of studyWay of compl.Extent
Full-time Graded credit 0+3

Subject aims expressed by acquired skills and competences

To apply knowledge of general principles of optical radiation in measuring defectoscopical methods in different production technologies.

Teaching methods

Summary

The subject is built on a series of laboratory measurements and develops the knowledge gained in previous studies within the subject Optical Diagnostic Methods, and uses a modern instrumentation base of Laboratory of Interferometry and Fibre Optics.

Compulsory literature:

[1] SOCHOR,V. Lasery a koherentní svazky. Academia, Praha, 1990. [2] JONES, S., R., WYKES, C. Holographic and Speckle Interferometry, Cambridge University Press, Cambridge 1985. [3] BALAŠ, J., SZABÓ,V. Holografická interferometria v experimentalnej mechanike. Veda, Bratislava, 1986. [4] PLUTA, M. Advanced Light Microscopy. PWN, Warszava 1988. [5] ENGST, P., HORÁK, M. Aplikace laserů. SNTL, Praha, 1989. [6] Články v odborných optických časopisech (např. Jemná mechanika a optika).

Recommended literature:

Way of continuous check of knowledge in the course of semester

E-learning

Other requirements

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Prerequisities

Subject has no prerequisities.

Co-requisities

Subject has no co-requisities.

Subject syllabus:

- Defectoscopy of isotropic samples by a method of interferometry (dispersion and thickness measurement, respectively). - Defectoscopy of anisotropic samples by a method of interferometry (dispersion and thickness measurement, respectively). - Defectoscopy of thin films and structures by a method of reflectometry, polarimetry and interferometry (thickness and geometry measurement of a structure, respectively). - Defectoscopy of thin films by a method of optical microscopy. - Defectoscopy of optical fibres by methods of optical interferometry.

Conditions for subject completion

Full-time form (validity from: 2009/2010 Summer semester, validity until: 2012/2013 Summer semester)
Task nameType of taskMax. number of points
(act. for subtasks)
Min. number of pointsMax. počet pokusů
Graded exercises evaluation Graded credit 100 (100) 51 3
        Optická defektoskopie Written test 100  51
Mandatory attendence participation:

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Conditions for subject completion and attendance at the exercises within ISP:

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Occurrence in study plans

Academic yearProgrammeBranch/spec.Spec.ZaměřeníFormStudy language Tut. centreYearWSType of duty
2012/2013 (N2102) Mineral Raw Materials (3911T001) Applied Physics of Materials P Czech Ostrava 2 Choice-compulsory study plan
2011/2012 (N2102) Mineral Raw Materials (3911T001) Applied Physics of Materials P Czech Ostrava 2 Choice-compulsory study plan
2010/2011 (N2102) Mineral Raw Materials (3911T001) Applied Physics of Materials P Czech Ostrava 2 Choice-compulsory study plan
2009/2010 (N2102) Mineral Raw Materials (3911T001) Applied Physics of Materials P Czech Ostrava 2 Choice-compulsory study plan

Occurrence in special blocks

Block nameAcademic yearForm of studyStudy language YearWSType of blockBlock owner

Assessment of instruction

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