516-0943/02 – Optical Spectroscopy and Ellipsometry (OSE)

Gurantor departmentInstitute of PhysicsCredits10
Subject guarantordoc. Dr. Mgr. Kamil PostavaSubject version guarantordoc. Dr. Mgr. Kamil Postava
Study levelpostgraduateRequirementChoice-compulsory
YearSemesterwinter + summer
Study languageCzech
Year of introduction2003/2004Year of cancellation2015/2016
Intended for the facultiesHGFIntended for study typesDoctoral
Instruction secured by
LoginNameTuitorTeacher giving lectures
POS40 doc. Dr. Mgr. Kamil Postava
Extent of instruction for forms of study
Form of studyWay of compl.Extent
Full-time Examination 20+0
Combined Examination 20+0

Subject aims expressed by acquired skills and competences

Explain methods of optical spectroscopy and ellipsometry used for characterization of thin films, multilayers, periodic systems, composites, and nanostructures. Classify basic methods - reflection and transmission spectroscopy in visible, near infrared and near ultraviolet spectral range, spectroscopic ellipsometry, Fourier transform infrared (FTIR) spectroscopy and magneto-optical spectroscopy.

Teaching methods

Lectures
Individual consultations

Summary

The main target of the course are methods of optical spectroscopy and ellipsometry used for characterization of thin films, multilayers, periodic systems, composites, and nanostructures. The course includes fundamentals of optical spectroscopy and ellipsometry, measurement configurations, interaction of light with metals, semiconductor, and dielectrics. Modeling of light reflection and transmission from multilayers, periodic gratings, and composite systems is completed by fitting of experimental data using optimization techniques. Effects of anisotropy, surface roughness, depolarization, and component imperfections are discussed. The course is mainly focused on reflection and transmission spectroscopy in visible, near infrared and near ultraviolet spectral range, spectroscopic ellipsometry, Fourier transform infrared (FTIR) spectroscopy and magneto-optical spectroscopy.

Compulsory literature:

1. S. Svanberg, Atomic and molecular spectroscopy: basic aspects and practical applications, Springer-Verlag, Berlin 1991. 2. D. S. Kliger, J. W. Lewis, C. E. Randall, Polarized light in optics and spectroscopy, Academic Press, New York 1990. 3. R. M. A. Azzam, N. M. Bashara, Ellipsometry and polarized light, North- Holland, Amsterdam 1977.

Recommended literature:

1. I. Ohlídal, D. Franta, Ellipsometry of thin film systems, In: Progress in Optics, Vol. 41, Ed. E. Wolf, 2000. 2. H. Tompkins and E. Irene, Handbook of Ellipsometry, William Andrew 2005. 1. Proceedings from ICSE conferences: Thin Solid Films Vol. 234 (1993), Vol. 290-291 (1996), Vol. 455-456 (2004)

Way of continuous check of knowledge in the course of semester

E-learning

Další požadavky na studenta

individual systematic study

Prerequisities

Subject has no prerequisities.

Co-requisities

Subject has no co-requisities.

Subject syllabus:

1. Physical principles of optical spectroscopy and ellipsometry - Electron transitions and the origin of the spectral dependences of the optical parameters - Modeling of dielectric function of materials - Kramers-Kronig dispersion relation, the relation of absorption and dispersion - Spectral device (dispersive prism, grating, Fabry-Perot interferometer) - Selected parts of optical thin films - Methods of effective environments and their use in optical spectroscopy 2. REFLECTION AND TRANSMISSION spectroscopy in the visible, near-ultraviolet A near-infrared - Components of spectrometers, the two-spectrometer - Materials used in optical spectroscopy - Resolution limit and instrumentation functions monochromator - Superstructure instruments for measuring reflection spectra, integrating sphere 3. Spectroscopic ellipsometry - Methods of ellipsometry, the ellipsometric measurement angles psi and delta, generalized ellipsometry - Type ellipsometer (zero ellipsometry, polarization modulation, rotating analyzer and rotating compensator) - Methods of averaging and error compensation - Methods of ellipsometric data 4. Spectroscopy in the mid-infrared - The physical origin of the infrared absorption spectrum characteristic vibrational - The principle of using a Fourier transform spectrometer (FTIR) - Modeling of the absorption maxima, chemical analysis 5. Magneto-optical spectroscopy - The origin of magneto-optical phenomena, Kerr, Faraday and magneto Voightův phenomenon - Cutting magneto phenomena according to the direction of magnetization - Specifics of magneto-optical ellipsometer 6. MODERN AND ADDITIONAL GUIDELINES optical spectroscopy - Emission spectroscopy - Laser spectroscopy, photoluminescence and fluorescence spectroscopy, Raman spectroscopy - Spectroscopy with a time resolution - Spectral measurements on ultrathin layers - Periodic diffraction grating systems 7. APPLICATION optical spectroscopy and ellipsometry IN RESEARCH A TECHNOLOGICAL PRACTICE

Conditions for subject completion

Full-time form (validity from: 2013/2014 Winter semester, validity until: 2015/2016 Summer semester)
Task nameType of taskMax. number of points
(act. for subtasks)
Min. number of points
Examination Examination  
Mandatory attendence parzicipation:

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Occurrence in study plans

Academic yearProgrammeField of studySpec.FormStudy language Tut. centreYearWSType of duty
2015/2016 (P1701) Physics (1702V001) Applied Physics P Czech Ostrava Choice-compulsory study plan
2015/2016 (P1701) Physics (1702V001) Applied Physics K Czech Ostrava Choice-compulsory study plan
2014/2015 (P1701) Physics (1702V001) Applied Physics P Czech Ostrava Choice-compulsory study plan
2014/2015 (P1701) Physics (1702V001) Applied Physics K Czech Ostrava Choice-compulsory study plan
2013/2014 (P1701) Physics (1702V001) Applied Physics P Czech Ostrava Choice-compulsory study plan
2013/2014 (P1701) Physics (1702V001) Applied Physics K Czech Ostrava Choice-compulsory study plan
2012/2013 (P1701) Physics (1702V001) Applied Physics P Czech Ostrava Choice-compulsory study plan
2012/2013 (P1701) Physics (1702V001) Applied Physics K Czech Ostrava Choice-compulsory study plan
2011/2012 (P1701) Physics (1702V001) Applied Physics P Czech Ostrava Choice-compulsory study plan
2011/2012 (P1701) Physics (1702V001) Applied Physics K Czech Ostrava Choice-compulsory study plan
2010/2011 (P1701) Physics (1702V001) Applied Physics P Czech Ostrava Optional study plan
2010/2011 (P1701) Physics K Czech Ostrava Optional study plan
2010/2011 (P1701) Physics (1702V001) Applied Physics K Czech Ostrava Optional study plan

Occurrence in special blocks

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