516-0947/01 – Measurement of Topography of Surfaces Created by Various Technological Processes (MTP)

Gurantor departmentInstitute of PhysicsCredits10
Subject guarantordoc. Ing. Jan Valíček, Ph.D.Subject version guarantordoc. Ing. Jan Valíček, Ph.D.
Study levelpostgraduateRequirementOptional
YearSemesterwinter + summer
Study languageCzech
Year of introduction2008/2009Year of cancellation2013/2014
Intended for the facultiesFMT, FS, FAST, FEI, HGFIntended for study typesDoctoral
Instruction secured by
LoginNameTuitorTeacher giving lectures
VAL30 doc. Ing. Jan Valíček, Ph.D.
Extent of instruction for forms of study
Form of studyWay of compl.Extent
Full-time Examination 20+0
Part-time Examination 20+0

Subject aims expressed by acquired skills and competences

To become acquainted the principles and devices of the surface topography measuring. To become acquainted the influence of technological process to the surface topography, which is very important to production increase at keeping the required quality of products, which is the goal of each technology

Teaching methods

Individual consultations


The main aim of the course is to provide a basic idea of measuring the topography of surface created by various technological processes. Understanding the principles of measuring the surface topography will enable the rational use of all possibilities of application of instruments and devices developed for studying the surface topography. Knowledge of the influence of technological process on the surface topography is very important to production increase at keeping the required quality of products, which is the goal of each technology. The course focuses on surface generation, its importance in various technologies, evaluation of surface topography, surface topography check by various methods (mechanical, optical, and others), and concentrates on contactless methods of surface topography detection.

Compulsory literature:

BECKMANN, P., SPIZZICHINO, A. The Scattering of Electromagnetic waves from Rough Surfaces. Oxford : Pergamon, 1963, 503 s. ISBN 63-10-108.

Recommended literature:

OGILVY, J. A. Theory of waves scattering from random rough surfaces. Bristol, IOP Publishing Ltd., 1992. 272 s. ISBN 0-7503-0063-9.

Way of continuous check of knowledge in the course of semester


Other requirements

ability of independent orientation in the field


Subject has no prerequisities.


Subject has no co-requisities.

Subject syllabus:

1. INTRODUCTION 2. HISTORICAL PERSPECTIVE ON SURFACE TOPOGRAPHY EVALUATION 3. DEFINITIONS 4. SURFACE CREATION BY CONVENTIONAL AND UNCONVENTIONAL METHOD a) Physical nature of a new surface creation b) Theoretical determination of workpiece surface roughness c) Machinability of materials in relation to surface topography 5. SURFACE TOPOGRAPHY AND ITS IMPORTANCE a) Surface topography and its importance in technological processes b) Perspectives and directions of development in the field of surface topography evaluation c) Surface topography as an indicator of quality d) Using a method of quantitative evaluation of surface roughness e) Marking of surface topography symbols on drawings 6. CONTROL OF SURFACE TOPOGRAPHY a) Distribution scale of methods and apparatus for evaluating and measuring surface topography b) Qualitative evaluation of surface topography c) Tools for increasing the accuracy of visual evaluation of surface topography d) Reliability of a qualitative evaluation of surface topography e) Indirect quantitative measurement of surface topography f) Contact profilometers with a gradual transformation of the profile g) Connection of mechanical and electrical sensors to electrical apparatus h) Selection of basic lengths for surface topography measurement i) Apparatus for writing of profilographs j) Accuracy verification of electrical contact profilometers k) Examples of mechanical- electrical profilometers with different basic types of sensors l) Devices with an immediate transformation of the profile m) Use of plastic imprints for surface topography measurement 7. OPTICAL METHODS FOR SURFACE TOPOGRAPHY MEASUREMENT a) Theoretical principles of optical methods and the interaction of light with a surface b) Method of visualization of phase differences by defocusing c) Method of scanning of the shadow distribution on the surface d) Method of scattered laser light intensity distribution e) Method of angle correlation of the laser speckle fields f) Grid projection method g) Method based on chromatic aberration of lens h) Scanning of quality of diffusely reflecting surfaces 8. USE OF ULTRASOUND WAVES FOR SURFACE AND INTERFACE EVALUATION a) Ultrasonic waves in an isotropic infinite environment b) Surface acoustic wave c) Physical and technical applications of various types of surface acoustic waves 9. QUANTITATIVE EVALUATION OF SURFACE MICROGEOMETRY a) Definitions of quantitative/qualitative surface topography evaluation b) Normalized characteristics of the surface topography c) Unnormalized characteristics of the surface topography d) Three-dimensional evaluation of surface topography e) Implementation of statistical and spectral analysis of surface profile 10. SURFACE TOPOGRAPHY AND FUNCTIONS OF AREAS OF COMPONENT PARTS a) In general about effects on the choice of surface topography b) Relationship of topography and function c) Relationship between topography and dimensional tolerances 11. CORPORATE SURFACE QUALITY INSPECTION

Conditions for subject completion

Conditions for completion are defined only for particular subject version and form of study

Occurrence in study plans

Academic yearProgrammeBranch/spec.Spec.ZaměřeníFormStudy language Tut. centreYearWSType of duty
2010/2011 (P1701) Physics K Czech Ostrava Optional study plan
2010/2011 (P1701) Physics (1702V001) Applied Physics K Czech Ostrava Optional study plan
2009/2010 (P1701) Physics (1702V001) Applied Physics P Czech Ostrava Optional study plan
2009/2010 (P1701) Physics (1702V001) Applied Physics K Czech Ostrava Optional study plan
2008/2009 (P1701) Physics K Czech Ostrava Optional study plan
2008/2009 (P1701) Physics P Czech Ostrava Optional study plan

Occurrence in special blocks

Block nameAcademic yearForm of studyStudy language YearWSType of blockBlock owner

Assessment of instruction

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