516-8820/01 – Optical and magnetic defectoscopy (OMD)
| Gurantor department | Institute of Physics | Credits | 6 |
| Subject guarantor | prof. RNDr. Petr Hlubina, CSc. | Subject version guarantor | prof. RNDr. Petr Hlubina, CSc. |
| Study level | undergraduate or graduate | Requirement | Choice-compulsory |
| Year | 2 | Semester | winter |
| | Study language | Czech |
| Year of introduction | 2013/2014 | Year of cancellation | 2015/2016 |
| Intended for the faculties | HGF | Intended for study types | Follow-up Master |
Subject aims expressed by acquired skills and competences
To acquaint oneself on a series of laboratory measurments with general approaches of use of optical diagnostics.
Teaching methods
Lectures
Tutorials
Experimental work in labs
Summary
The subject is connected with the student's knowledge of mathematics, physics and materials. The course is built on a series of laboratory measurements and theory to them and develops the knowledge obtained in previous studies.
Compulsory literature:
Engst, P., Horák, M.: Laser Applications (in Czech), SNTL, Prague 1989;
Sochor,V.: Lasers and Coherent Beams (in Czech), Academia, Prague 1990;
Hariharan, P.: Optical Interferometry, Academic Press, New York 1985.
Recommended literature:
Balaš, J., Szabó,V.: Holographic Interferometry in Experimental Mechanics, Veda, Bratislava 1986.
Pluta, M.: Advanced Light Microscopy. PWN, Warszava 1988.
Way of continuous check of knowledge in the course of semester
Elaboration of measurement protocols.
E-learning
Not available.
Other requirements
It is supposed a systematic work of a student of a Magister study.
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
1. Defectoscopy of izotropic samples by an interferometric method (dispersion measurement, thickness measurement).
2. Defectoscopy of anizotropic samples by an interferometric method (dispersion measurement, thickness measurement).
3. Defectoscopy of thin films and structures metodou by a reflectometric, polarimetric and interferometric method (thickness measurement, geometry measurement of a structure).
4. Defectoscopy of thin films by a method of optical microscopy.
5. Defectoscopy of optical fibres by methods of optical interferometry.
6. Physical introduction in magnetic defectoscopy.
7. Magnetic defectoscopy of steel ropes and pipes (survey of rope states) by a method of flow dissipation.
8. Magnetic defectoscopy by means of whirling currents.
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction
Předmět neobsahuje žádné hodnocení.