617-3028/02 – Methods of structural and phase analysis of nanomaterials (MSFAN)

Gurantor departmentDepartment of ChemistryCredits4
Subject guarantordoc. Ing. Vlastimil Matějka, Ph.D.Subject version guarantordoc. Ing. Vlastimil Matějka, Ph.D.
Study levelundergraduate or graduateRequirementCompulsory
Study languageEnglish
Year of introduction2021/2022Year of cancellation
Intended for the facultiesFMTIntended for study typesFollow-up Master
Instruction secured by
LoginNameTuitorTeacher giving lectures
MAT27 doc. Ing. Vlastimil Matějka, Ph.D.
Extent of instruction for forms of study
Form of studyWay of compl.Extent
Full-time Credit and Examination 2+1

Subject aims expressed by acquired skills and competences

The aim of the course is to acquaint the students with the issues connected to the structure of the nanomaterials and with the -ray diffraction technique as the method for their description. After the completing of the lectures the students will be able to utilize the X-ray diffraction technique for the characterization of the nanomaterials, perform the diffraction experiment and evaluate the measured data.

Teaching methods

Individual consultations
Experimental work in labs


The subject is focused on the methods for the characterization of the phase composition and structure of the nanomaterials. The subject will enable to understand the significance of the X-ray diffraction analysis for the characterization of the nanomaterials. The initial lectures are oriented on the description of the materials´ structure, the terms connected to the symmetry of the crystal structures and crystallochemistry will be defined. Next part of the lectures will provide the insight into the origin and the characteristics of the X-ray irradiation, its interactions with the matter. Information about the X-ray diffraction techniques, the X-ray diffractometers construction and the individual functional attachments will be the part of next block of the lectures. The application of the X-ray diffraction analysis for qualitative and quantitative phase analysis will be described. In the last block of the lectures, the utilization of the diffraction methods for the structural characterization of the nanomaterials will be described.

Compulsory literature:

WASEDA, Yoshio, Eiichiro MATSUBARA a Kozo SHINODA. X-Ray Diffraction Crystallography. 1. Berlin: Springer-Verlag Berlin Heidelberg, 2011. ISBN 978-3-642-16635-8.

Recommended literature:

SURYANARAYANA, C. a M. GRANT NORTON. X-Ray Diffraction A Practical Approach. 1. New York: Springer US, 1998. ISBN 978-0-306-45744-9.

Way of continuous check of knowledge in the course of semester

Oral exam.


Other requirements

There are not any additional requirements.


Subject has no prerequisities.


Subject has no co-requisities.

Subject syllabus:

1. General terms from the mineralogy and crystallography. Crystal systems, Bravais lattices, direction indices, Miller indices of lattice planes. 2. Macroscopic symmetry of the crystals, space groups and the effect of their symmetry on the properties of the crystals. 3. Reciprocal lattice, construction, relations in the reciprocal space, Ewald sphere. 4. Real crystal structures. Isomorphy, polymorphy, polytypism, defects in the crystal structures. 5. Origination of the X-ray irradiation, X-ray sources. Interaction of the X-ray irradiation with matter, diffraction of X-rays on the crystal lattice, influence of the atom position on the diffraction pattern. 6. Overview of the X-ray diffraction techniques, methods of the single-crystal diffraction, studies of the powder and polycrystalline samples. 7. Construction of the X-ray diffractometers, setups. 8. Attachments (primary, secondary optics, sample holders, chambers, detectors). 9. X-ray diffraction pattern, the information inside the patterns. 10. Application of the diffraction methods. Qualitative and quantitative diffraction analysis, determination of the lattice parameters. 11. Determination of the crystallite size, study of the lattice strain. Utilization of the X-ray diffraction for the characterization of the textures. 12. X-ray diffraction at high temperatures and pressures. 13. Rietveld methods for the quantitative phase analysis. 14. Neutron diffraction experiments (neutron sources, diffraction experiment, examples of the neutron diffraction analysis). X-ray tomography, principle, practical utilization.

Conditions for subject completion

Full-time form (validity from: 2021/2022 Winter semester)
Task nameType of taskMax. number of points
(act. for subtasks)
Min. number of points
Credit and Examination Credit and Examination 100 (100) 51
        Credit Credit 30  16
        Examination Examination 70  35
Mandatory attendence parzicipation: 80% participation in exercises

Show history

Occurrence in study plans

Academic yearProgrammeField of studySpec.ZaměřeníFormStudy language Tut. centreYearWSType of duty
2021/2022 (N0719A270003) Nanotechnology MCH P English Ostrava 1 Compulsory study plan

Occurrence in special blocks

Block nameAcademic yearForm of studyStudy language YearWSType of blockBlock owner