636-0407/02 – Techniques of Structure Characterization (MSS)
| Gurantor department | Department of Material Engineering | Credits | 8 |
| Subject guarantor | prof. Ing. Vlastimil Vodárek, CSc. | Subject version guarantor | prof. Ing. Vlastimil Vodárek, CSc. |
| Study level | undergraduate or graduate | Requirement | Compulsory |
| Year | 3 | Semester | summer |
| | Study language | Czech |
| Year of introduction | 2012/2013 | Year of cancellation | 2019/2020 |
| Intended for the faculties | FMT | Intended for study types | Bachelor |
Subject aims expressed by acquired skills and competences
- Define basic reasons and aims of structural studies;
- Describe fundamentals of optical microscopy, demonstrate basic applications of optical microscopy;
- Characterise results of interaction of X ray radiation and electron beam with a specimen;
- Define fundamentals of diffraction analysis, describe principles of spectral analysis;
- Characterise fundamentals, possibilities and applications of transmission electron microscopy;
- Characterise fundamentals, possibilities and applications of scanning electron microscopy;
- Describe modern experimental techniques based on a scanning probe;
- Demonstrate applications of structural analysis for solutions of technical problems.
Teaching methods
Lectures
Tutorials
Experimental work in labs
Summary
This course is dealing with basic principles, possibilities and limitations of
the most important experimental techniques for structure characterization of
technical materials. An attention is mainly paid to the following techniques:
optical microscopy, X ray diffraction and spectral analyses, transmission
electron microscopy, scanning electron microscopy, X ray microanalysis and
scanning probe microscopy techniques. Some examples of structure
characterization of advanced materials are presented.
Compulsory literature:
Recommended literature:
WHISTON, C. X-ray methods. Chichester: Wiley Blackwell, 1987. ISBN-13: 978-0471913863.
Way of continuous check of knowledge in the course of semester
E-learning
Other requirements
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Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
Lectures:
- Materialography - characterisation of structural parameters of technical materials.
- Basic reasons and aims of materials structure characterisation.
- Light microscopy. Beam diagrams in thin lenses. Focal distance. Depth of focus. Defects in thin lenses. Spatial resolution of light microscopy.
- Scheme of light microscope. Methods of image contrast improvement: bright field, dark field, polarised light, phase contrast. Microhardness.
- Preparation of specimens for light microscopy (metals, composites, ceramics). Chemical and electrolytic etching of specimens for revealing of microstructure.
- Basic principles of quantitative microscopy. Typical applications of light microscopy in materials science.
- Interaction of X rays and electrons with specimens. Diffraction on crystal lattice: Bragg´s equation. Reciprocal lattice. Ewald sphere. Absorption of radiation.
- X ray diffraction on polycrystalline materials. Qualitative and quantitative analyses. Texture analysis.
- X ray analysis on monocrystals. Applications of X ray diffraction for evaluation of internal stresses in technical materials: X ray tensometry.
- X ray fluorescence analysis and X ray microscopy. Typical applications of X rays in materials science.
- Principle of transmission electron microscope. Contrast mechanisms in amorphous and crystalline materials. Amplitude contrast: bright fied and dark field images.
- Phase contrast: lattice image and high resolution structure imaging. Electron diffraction. Diffraction constant. Analysis of diffraction patterns - monocrystals and polycrystals.
- Preparation of specimens for transmission electron microscopy: extraction carbon replicas and thin metallic foils. Preparation of specimens from non conductive materials.
- Principle of scanning electron microscope. Basic mechanisms of image contrast formation. Environmental scanning electron microscopy (ESEM). Diffraction of backscattered electrons (EBSD). Preparation of specimens for scanning electron microscopy.
- X ray microanalysis. Basic principles of wave length and energy dispersive microanalysis. Qualitative and quantitative X ray microanalysis.
- Auger spectroscopy. Electron energy loss spectroscopy (EELS). Energy filtered transmission electron microscopy (EFTEM). Typical applications of electron microscopy and X ray microanalysis in materials science.
- Scanning probe microscopy techniques - Scanning tunelling microscopy (STM) and Atomic force microscopy (AFM).
- Ion field microscopy and Atom probe FIM.
Seminars:
1. Introduction.
2. Preparation of specimens for light microscopy, etching of specimens. Qualitative phase analysis.
3. Microcleanliness evaluation of steels. Grain size measurement.
4. Evaluation of volume fraction of phases in technical materials. Microhardness measurement of microstructural constituents and phases.
5. X-ray absorption in specimens. Basics of crystallography. Transformation matrices.
6. Qualitative X-ray diffraction analysis.
7. Quantitative X-ray diffraction analysis.
8. Test - light microscopy and X-ray diffraction.
9. Calculation of diffraction constant of electron microscope. Interpretation of ring diffraction patterns.
10. Interpretation of spot diffraction patterns.
11. Final test, credit.
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction