636-0829/01 – Special Methods of Testing (SZM)
| Gurantor department | Department of Material Engineering | Credits | 5 |
| Subject guarantor | prof. Ing. Vlastimil Vodárek, CSc. | Subject version guarantor | prof. Ing. Vlastimil Vodárek, CSc. |
| Study level | undergraduate or graduate | Requirement | Choice-compulsory |
| Year | 1 | Semester | summer |
| | Study language | Czech |
| Year of introduction | 2004/2005 | Year of cancellation | 2015/2016 |
| Intended for the faculties | FMT | Intended for study types | Follow-up Master |
Subject aims expressed by acquired skills and competences
- Define basic reasons and aims of structural studies;
- Describe fundamentals of optical microscopy, demonstrate basic applications of optical microscopy;
- Characterise results of interaction of X ray radiation and electron beam with a specimen;
- Define fundamentals of diffraction analysis, describe principles of spectral analysis;
- Characterise fundamentals, possibilities and applications of transmission electron microscopy;
- Characterise fundamentals, possibilities and applications of scanning electron microscopy;
- Describe modern experimental techniques based on a scanning probe;
- Demonstrate applications of structural analysis for solutions of technical problems.
Teaching methods
Lectures
Tutorials
Experimental work in labs
Summary
The aim of this course is to improve the knowledge of students in the field of
microstructural characterisation of materials. Lectures are dealing with
electron microscopy and spectroscopy techniques: transmission electron
microscopy, scanning electron microscopy, Auger spectroscopy and rtg spectral
microanalysis. Practical examples are used to illustrate basic mechanisms of
image contrast formation, diffraction analysis and local chemical microanalysis.
Compulsory literature:
[1] Williams, D. B., Carter, C. B.: Transmission Electron Microscopy, A Textbook for Materials Science, 2nd ed., Springer, 2009.
[2] Goldstein, J. et al.: SEM and X – ray Microanalysis, 3rd ed., Springer, 2003.
Recommended literature:
[1] Whiston, C.: X-Ray Methods, J. Wiley & Sons, Chichester, 1987.
Additional study materials
Way of continuous check of knowledge in the course of semester
E-learning
Other requirements
There are no further requirements.
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
Lectures:
- The aim of the course, contents.
- Resolution of microscopic techniques, interaction of electron beam and X-ray beam with specimens.
- Basics of crystallography, properties of reciprocal lattice.
- Geometry of diffraction, structure factor.
- Principle of transmission and scanning electron microscope.
- Contrast mechanisms in transmission electron microscopy: amplitude and phase contrast.
- Basic principles of kinematic and dynamic theory of electron scattering, contrast on defects of crystal lattice.
- Electron diffraction techniques: selected area electron diffraction and convergent electron beam diffraction.
- Analysis of diffraction patterns from monocrystals and polycrystals.
- Quantitative electron microscopy, density of line defects.
- Preparation of specimens for transmission electron microscopy.
- Contrast mechanisms in scanning electron microscopy.
- X-ray spectral microanalysis: wave length and energy dispersive analysis.
- Basic applications of transmission and scanning electron microscopy in physical metallurgy.
- Auger electron spectroscopy, special spectroscopic techniques.
- Principles of ion microscopy and atom probe mass spectrometer.
Seminars:
1. Introduction, safety rules in laboratories.
2. Crystal geometry.
3. Reciprocal lattice, programme No. 1.
4. Structure factor, X-ray absorption.
5. Stereographic projection.
6. Transformation matrices, programme No. 2.
7. Preparation of carbon extraction replicas.
8. Diffraction constant, interpretation of spot diffraction patterns.
9. Interpretation of ring diffraction patterns, programme No. 3.
10. Dislocation density.
11. Quantitative electron microscopy, orientation relationship between precipitates and matrix.
12. Calibration of rotation between image and diffraction pattern, programme No. 4.
13. Identification of minor phases in steels.
14. Final test, credit,
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction
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