636-0937/01 – Modern Techniques of Structure and Phase Analysis (MMSFA)
| Gurantor department | Department of Material Engineering | Credits | 10 |
| Subject guarantor | prof. Ing. Vlastimil Vodárek, CSc. | Subject version guarantor | prof. Ing. Vlastimil Vodárek, CSc. |
| Study level | postgraduate | Requirement | Choice-compulsory |
| Year | | Semester | winter + summer |
| | Study language | Czech |
| Year of introduction | 2004/2005 | Year of cancellation | 2011/2012 |
| Intended for the faculties | FMT | Intended for study types | Doctoral |
Subject aims expressed by acquired skills and competences
PhD students will learn about principles of the most important techniques of structure, diffraction and spectral analyses, with possibilities and limitations of individual techniques of structure characterisation, with fundamentals of interpretation of structure analysis results. They will be able to define appropriate techniques of structure characterization needed to solve a problem and to prepare specimens for basic experimental techniques.
Teaching methods
Lectures
Individual consultations
Experimental work in labs
Summary
The aim of the course is to deepen the knowledge of PhD students in the field of structure and phase analyses of engineering materials. Lectures are mainly focused on qualitative and quantitative structure characterisation by using light microscopy, techniques based on the focused electron beam (electron microscopy) and X - ray diffraction. The attention is paid to applications of structure parameters in analysis structure - property relationships in engineering materials. Possibilities and limitations of individual experimental techniques are demonstrated on case studies.
Compulsory literature:
Recommended literature:
Way of continuous check of knowledge in the course of semester
E-learning
Other requirements
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Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
Lectures:
- Basic reasons and aims of structure characterisation in technical materials at different scale levels (macrostructure, microstructure, nanostructure). Comparison of spatial resolution of various experimental techniques.
- Light microscopy. Principle of light microscope. Preparation of specimens. Typical applications of light microscopy in quality assessment of materials: microcleanliness, microstructure and grain size.
- Quantitative microscopy, automated image analysis, basic stereological parameters,. Analysis of projected images. Principles of stereological evaluations. Measurement errors.
- Interaction of X-rays or electron beam with a specimen. Basic properties of reciprocal lattice. Geometrical conditions of diffraction: Bragg´s law and Ewald sphere.
- X-ray diffraction methods of analysis of polycrystalline materials. Typical tasks of X-ray diffraction analysis. Quantitative analyses - internal standard and external standard methods, standardless method.
- Tensometry. Macrostresses, evaluation of grain size in coarse grained materials. Evaluation of microstresses: 2nd and 3rd order stresses.
- Principles of preffered orientation evaluation - texture analysis. X-ray diffraction analysis of monocrystals. X-ray fluorescence analysis of elemental composition. Neutron diffraction.
- Instrumentation based on applications of focused electron beam. Principles of transmission and scanning electron microscope.
- Mechanisms of contrast formation in transmission electron microscope: amplitude and phase contrast. Basic principles of kinematic and dynamic theory of electron scattering, contrast on crystal lattice defects. Transmission electron microscopy with high resolution (HRTEM).
- Preparation of specimens for transmission electron microscopy. Focused ion beam technique (FIB).
- Electron diffraction techniques: selected area diffraction and diffraction of convergent electron beam. Interpretation of diffraction patterns from monocrystals and polycrystals.Spectroscopic techniques EDX and EELS.
- Mechanisms of contrast formation in scanning electron microscopy. Interpretation of secondary electron images and back scattered electron images. Diffraction of backscattred electrons (EBSD). X-ray microanalysis: wave length and energy dispersive spectroscopy. Auger electron spectroscopy.
- Scanning probe microscopy techniques - AFM, STM, MFM. Ion field microscopy.
- Examples of applications of structural characterisation in materials engineering.
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction
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