636-0937/02 – Modern Techniques of Structure and Phase Analysis (MMSFA)
Gurantor department | Department of Material Engineering | Credits | 10 |
Subject guarantor | prof. Ing. Vlastimil Vodárek, CSc. | Subject version guarantor | prof. Ing. Vlastimil Vodárek, CSc. |
Study level | postgraduate | Requirement | Choice-compulsory |
Year | | Semester | winter + summer |
| | Study language | Czech |
Year of introduction | 2011/2012 | Year of cancellation | 2022/2023 |
Intended for the faculties | FMT | Intended for study types | Doctoral |
Subject aims expressed by acquired skills and competences
PhD students will learn about principles of the most important techniques of structure, diffraction and spectral analyses, with possibilities and limitations of individual techniques of structure characterisation, with fundamentals of interpretation of structure analysis results. They will be able to define appropriate techniques of structure characterization needed to solve a problem and to prepare specimens for basic experimental techniques.
Teaching methods
Lectures
Individual consultations
Experimental work in labs
Summary
The aim of the course is to deepen the knowledge of PhD students in the field of structure and phase analyses of engineering materials. Lectures are mainly focused on qualitative and quantitative structure characterisation by using light microscopy, techniques based on the focused electron beam (electron microscopy) and X - ray diffraction. The attention is paid to applications of structure parameters in analysis structure - property relationships in engineering materials. Possibilities and limitations of individual experimental techniques are demonstrated on case studies.
Compulsory literature:
Recommended literature:
Way of continuous check of knowledge in the course of semester
E-learning
Other requirements
There are no further special requirements.
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
1. Basic reasons and goals of structure characterization at a wide range of length scales (macrostructure, microstructure, nanostructure). Comparison of spatial resolution limits of microscopic techniques.
2. Light microscopy. Principle of light microscope. Preparation of specimens. Typical tasks of light microscopy at quality control of materials – microstructure, micro-cleanliness and grain size. Quantitative metallography, automated image analysis. Analysis of projected images. Errors of measurement.
3. Interaction of X-ray and electrons with specimens. Basic rules for reciprocal lattice. Geometrical conditions of diffraction. Bragg´s law and Ewald sphere.
4. X-ray diffraction analysis of polycrystalline materials. Typical tasks of X-ray diffraction analysis. Quantitative analysis – methods of internal and external standards, standardless analysis.
5. Evaluation of residual stresses. Macro-stress, determination of particle size in coarse grained materials. Principles of texture evaluation. X-ray diffraction analysis on single crystals. X- ray fluorescence analysis. Neutron diffraction.
6. Instruments based on focused electron beam. Principles of transmission and scanning electron microscopes.
7. Contrast mechanisms in transmission electron microscopy: amplitude, phase and Z contrasts. Basic principles of kinematic and dynamic theory of electron scattering, contrast on crystallographic defects.
8. High resolution transmission electron microscopy (HRTEM).
9. Preparation of specimens for transmission electron microscopy. Focused ion beam technique.
10. Electron diffraction techniques: selected area diffraction and convergent beam diffraction. Interpretation of diffraction patterns from single crystals and polycrystalline materials. EDX and EELS techniques.
11. Contrast mechanisms in scanning electron microscopy. Interpretation of images in secondary electrons and in backscattered electrons. Electron back scattered diffraction (EBSD).
12. X ray microanalysis: wave and energy dispersive analyses (EDX and WDX). Auger spectroscopy.
13. Probe scanning microscopy: AFM, STM and MFM. Field ion microscopy and atom probe tomography (APT).
14. Examples of structure characterization in the field of materials sciencew and engineering.
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction