636-3011/04 – Structure Characterization of Materials (SFAn)
| Gurantor department | Department of Material Engineering | Credits | 6 |
| Subject guarantor | prof. Ing. Vlastimil Vodárek, CSc. | Subject version guarantor | prof. Ing. Vlastimil Vodárek, CSc. |
| Study level | undergraduate or graduate | Requirement | Compulsory |
| Year | 2 | Semester | winter |
| | Study language | English |
| Year of introduction | 2019/2020 | Year of cancellation | 2022/2023 |
| Intended for the faculties | FMT | Intended for study types | Follow-up Master |
Subject aims expressed by acquired skills and competences
Gained knowledge: basic microscopic, diffraction and spectroscopy techniques used in materials engineering, possibilities and limitations of individual techniques of structure characterization, interpretation of results.
Gained skills: choice of an optimal structure characterization techniques for a task investigated, basic interpretation of structure characterisation results.
Teaching methods
Lectures
Tutorials
Experimental work in labs
Summary
The goal of the course is to make knowledge of students deeper in the field of structure characterization of progressive materials. The most important experimental techniques, their physical principles, possibilities and limitations are discussed. An attention is paid to interpretation of results, modern methods of specimen preparation, methodology of appropriate techniques selection for getting required information. Applications of structure characterization for solving material engineering tasks are presented on some examples from both engineering practice and development of new materials.
Compulsory literature:
Recommended literature:
DYSON, D. J. X-ray and electron diffraction studies in materials science, London: Maney Publishing, 2003. ISBN 1-902653- 74- 2.
THOMAS G. Transmission electron microscopy. New York: J. Wiley & Sons, 1980.
Additional study materials
Way of continuous check of knowledge in the course of semester
Continuous verification of learning outcomes:
full-time study form – 2 written tests, 2 programs processed during the semester;
combined study form – 1 semestral project.
Final verification of study results:
both full-time and combined study form - written exam.
E-learning
Other requirements
There are no further requirements.
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
1. Basic reasons and goals of structure characterization at a wide range of length scales (macrostructure, microstructure, nanostructure). Comparison of spatial resolution limits of microscopic techniques.
2. Light microscopy. Principle of light microscope. Preparation of specimens. Typical tasks of light microscopy at quality control of materials – microstructure, micro-cleanliness and grain size. Quantitative metallography, automated image analysis. Analysis of projected images. Errors of measurement.
3. Interaction of X-ray and electrons with specimens. Basic rules for reciprocal lattice. Geometrical conditions of diffraction. Bragg´s law and Ewald sphere.
4. X-ray diffraction analysis of polycrystalline materials. Typical tasks of X-ray diffraction analysis. Quantitative analysis – methods of internal and external standards, standardless analysis.
5. Evaluation of residual stresses. Macro-stress, determination of particle size in coarse grained materials. Principles of texture evaluation. X-ray diffraction analysis on single crystals. X- ray fluorescence analysis. Neutron diffraction.
6. Instruments based on focused electron beam. Principles of transmission and scanning electron microscopes.
7. Contrast mechanisms in transmission electron microscopy: amplitude, phase and Z contrasts. Basic principles of kinematic and dynamic theory of electron scattering, contrast on crystallographic defects.
8. High resolution transmission electron microscopy (HRTEM).
9. Preparation of specimens for transmission electron microscopy. Focused ion beam technique.
10. Electron diffraction techniques: selected area diffraction and convergent beam diffraction. Interpretation of diffraction patterns from single crystals and polycrystalline materials. EDX and EELS techniques.
11. Contrast mechanisms in scanning electron microscopy. Interpretation of images in secondary electrons and in backscattered electrons. Electron back scattered diffraction (EBSD).
12. X ray microanalysis: wave and energy dispersive analyses (EDX and WDX). Auger spectroscopy.
13. Probe scanning microscopy: AFM, STM and MFM. Field ion microscopy and atom probe tomography (APT).
14. Examples of structure characterization in the field of materials engineering.
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction
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