651-3028/01 – Methods of structural and phase analysis of nanomaterials (MSFAN)
| Gurantor department | Department of Chemistry and Physico-Chemical Processes | Credits | 4 |
| Subject guarantor | doc. Ing. Vlastimil Matějka, Ph.D. | Subject version guarantor | doc. Ing. Vlastimil Matějka, Ph.D. |
| Study level | undergraduate or graduate | Requirement | Compulsory |
| Year | 1 | Semester | winter |
| | Study language | Czech |
| Year of introduction | 2022/2023 | Year of cancellation | |
| Intended for the faculties | FMT | Intended for study types | Follow-up Master |
Subject aims expressed by acquired skills and competences
The aim of the course is to acquaint the students with the issues connected to the structure of the nanomaterials and with the -ray diffraction technique as the method for their description. After the completing of the lectures the students will be able to utilize the X-ray diffraction technique for the characterization of the nanomaterials, perform the diffraction experiment and evaluate the measured data.
Teaching methods
Lectures
Individual consultations
Experimental work in labs
Summary
The subject is focused on the methods for the characterization of the phase composition and structure of the nanomaterials. The subject will enable to understand the significance of the X-ray diffraction analysis for the characterization of the nanomaterials. The initial lectures are oriented on the description of the materials´ structure, the terms connected to the symmetry of the crystal structures and crystallochemistry will be defined. Next part of the lectures will provide the insight into the origin and the characteristics of the X-ray irradiation, its interactions with the matter. Information about the X-ray diffraction techniques, the X-ray diffractometers construction and the individual functional attachments will be the part of next block of the lectures. The application of the X-ray diffraction analysis for qualitative and quantitative phase analysis will be described. In the last block of the lectures, the utilization of the diffraction methods for the structural characterization of the nanomaterials will be described.
Compulsory literature:
Recommended literature:
Way of continuous check of knowledge in the course of semester
Oral exam.
E-learning
Other requirements
There are not any additional requirements.
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
1. General terms from the mineralogy and crystallography. Crystal systems, Bravais lattices, direction indices, Miller indices of lattice planes.
2. Macroscopic symmetry of the crystals, space groups and the effect of their symmetry on the properties of the crystals.
3. Reciprocal lattice, construction, relations in the reciprocal space, Ewald sphere.
4. Real crystal structures. Isomorphy, polymorphy, polytypism, defects in the crystal structures.
5. Origination of the X-ray irradiation, X-ray sources. Interaction of the X-ray irradiation with matter, diffraction of X-rays on the crystal lattice, influence of the atom position on the diffraction pattern.
6. Overview of the X-ray diffraction techniques, methods of the single-crystal diffraction, studies of the powder and polycrystalline samples.
7. Construction of the X-ray diffractometers, setups.
8. Attachments (primary, secondary optics, sample holders, chambers, detectors).
9. X-ray diffraction pattern, the information inside the patterns.
10. Application of the diffraction methods. Qualitative and quantitative diffraction analysis, determination of the lattice parameters.
11. Determination of the crystallite size, study of the lattice strain. Utilization of the X-ray diffraction for the characterization of the textures.
12. X-ray diffraction at high temperatures and pressures.
13. Rietveld methods for the quantitative phase analysis.
14. Neutron diffraction experiments (neutron sources, diffraction experiment, examples of the neutron diffraction analysis). X-ray tomography, principle, practical utilization.
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction