651-3028/02 – Methods of structural and phase analysis of nanomaterials (MSFAN)
| Gurantor department | Department of Chemistry and Physico-Chemical Processes | Credits | 4 |
| Subject guarantor | prof. Ing. Vlastimil Matějka, Ph.D. | Subject version guarantor | prof. Ing. Vlastimil Matějka, Ph.D. |
| Study level | undergraduate or graduate | | |
| | Study language | English |
| Year of introduction | 2022/2023 | Year of cancellation | |
| Intended for the faculties | FMT | Intended for study types | Follow-up Master |
Subject aims expressed by acquired skills and competences
The aim of the course is to acquaint the students with the issues connected to the texture and structure of the nanomaterials. In the field of material texture, students will also gain knowledge of 3D microscopic techniques, the determination of specific surface area, and particle size. To study the structure of materials, students will learn about X-ray diffraction analysis. After completing this course, students will be able to design a suitable method for studying the texture of material surfaces and use X-ray diffraction analysis to characterize nanomaterials, perform their own diffraction experiments, and interpret the measured data.
Teaching methods
Lectures
Individual consultations
Experimental work in labs
Field trip
Summary
The course focuses on methods for characterizing the texture, phase composition, and structure of nanomaterials. It also enables students to understand the importance of X-ray diffraction analysis for the study of nanomaterials. The introductory lectures will focus on methods for characterizing the texture parameters of compact and powder materials. The following subject will enable understanding the significance of the X-ray diffraction analysis for the characterization of the nanomaterials. The lectures are oriented on the description of the materials´ structure, and the terms connected to the symmetry of the crystal structures and crystallochemistry will be defined. The following part of the lectures will provide insight into the origin and the characteristics of the X-ray irradiation, its interactions with matter. Information about the X-ray diffraction techniques, the X-ray diffractometers construction, and the individual functional attachments will be part of the next block of the lectures. The application of the X-ray diffraction analysis for qualitative and quantitative phase analysis will be described. In the last block of the lectures, the utilization of the diffraction methods for the structural characterization of the nanomaterials will be described.
Compulsory literature:
Recommended literature:
Additional study materials
Way of continuous check of knowledge in the course of semester
Oral exam.
E-learning
https://www.vsb.cz/e-vyuka/en/subject/651-3028/02
Other requirements
There are not any additional requirements.
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
1. Methods of texture analysis of solid and powder material surfaces. Profilometry, 3D microscopy.
2. Specific surface area of powder materials. Physical adsorption of gases. Isotherms. Pore size distribution. Mercury porosimetry.
3. Particle size. Sieve analysis, sedimentation methods, laser granulometry, DLS method.
4. General terms from mineralogy and crystallography. Crystal systems, Bravais lattices, direction indices, Miller indices of lattice planes.
5. Macroscopic symmetry of the crystals, space groups, and the effect of their symmetry on the properties of the crystals.
6. Real crystal structures. Isomorphy, polymorphy, polytypism, and defects in the crystal structures.
7. Origination of the X-ray irradiation, X-ray sources. Interaction of the X-ray irradiation with matter, diffraction of X-rays on the crystal lattice, and influence of the atom position on the diffraction pattern.
8. Overview of the X-ray diffraction techniques, methods of the single-crystal diffraction, studies of the powder and polycrystalline samples.
9. Construction of the X-ray diffractometers, setups.
10. Attachments (primary, secondary optics, sample holders, chambers, detectors).
11. X-ray diffraction pattern, the information inside the patterns.
12. Application of the diffraction methods. Qualitative and quantitative diffraction analysis, determination of the lattice parameters.
13. Rietveld methods for the quantitative phase analysis
14. Determination of the crystallite size, study of the lattice strain. Utilization of X-ray diffraction for the characterization of the textures.
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction
Předmět neobsahuje žádné hodnocení.