653-2024/02 – Characterization of structure and composition of materials (CSSM)
| Gurantor department | Department of Materials Engineering and Recycling | Credits | 6 |
| Subject guarantor | prof. Ing. Vlastimil Vodárek, CSc. | Subject version guarantor | prof. Ing. Vlastimil Vodárek, CSc. |
| Study level | undergraduate or graduate | Requirement | Compulsory |
| Year | 3 | Semester | winter |
| | Study language | English |
| Year of introduction | 2023/2024 | Year of cancellation | |
| Intended for the faculties | FMT | Intended for study types | Bachelor |
Subject aims expressed by acquired skills and competences
The aim of the course is to introduce students to modern methods of studying the structure and composition of technical materials. Based on the acquired knowledge, students will be able to prepare samples for various methods of structural and spectral analysis. They will be able to design suitable experimental methods for solving the given problem.
Teaching methods
Lectures
Seminars
Tutorials
Experimental work in labs
Project work
Summary
The subject deals with modern methods of characterizing the structure of technical materials, their possibilities and limitations. The subject also includes selected methods of studying the chemical composition of materials that are commonly used in metallurgy and engineering. The results of structural phase analysis of technical materials using basic experimental methods are demonstrated on practical examples.
Compulsory literature:
Recommended literature:
Way of continuous check of knowledge in the course of semester
Continuous verification of learning outcomes:
full-time study form - 2 written tests, 2 written programs during the semester;
combined study form - 1 semestral project.
Final verification of study results:
written exam.
E-learning
Other requirements
There are no further special requirements.
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
1. Materiallography – characterization of structural parameters of engineering materials at different size scales: macrostructure, microstructure and substructure. Basic reasons for studying structure and chemical composition of materials.
2. Light microscopy. Scheme of the light microscope. Focal length. Depth of focus. Defects of thin lenses. Spatial resolution. Preparation of specimens for light microscopy. Revealing of microstructure of metals by chemical and electrolytic etching.
3. Basics of image analysis. Methods of image contrast enhancement. Microhardness testing. Confocal microscopy – principle, spatial resolution. Typical applications of light microscopy in materials engineering.
4. Interaction of electrons and X-rays photons with specimens. Diffraction on crystal lattice – Laue conditions, Bragg´s equation. Reciprocal lattice. Ewald´s sphere. Methods of X-ray diffraction analysis (XRD). Qualitative and quantitative XRD phase analyses of materials. Texture analysis. Evaluation of macro- and microstresses in engineering materials. Typical applications of X-ray analysis in materials engineering.
5. Transmission electron microscopy – basic principles. Contrast mechanisms in amorphous and crystalline materials. Amplitude contrast – bright field and dark field images. Phase contrast – lattice and structure imaging.
6. Electron diffraction. Diffraction constant. Analysis of diffraction patterns: single - and polycrystals. Preparation of specimens for transmission electron microscopy: extraction carbon replicas and thin foils. Preparation of foils using the focused ion beam method (FIB).
7. Scanning electron microscopy – basic principles. Basic mechanisms of the contrast formation. Environmental scanning electron microscopy (ESEM). Preparation of specimens for scanning electron microscopy.
8. Diffraction of backscattered electrons (EBSD). Typical applications of electron microscopy in materials engineering.
9. Basic requirements for chemical analysis of materials. Classification of methods of chemical analysis of inorganic substances. Sampling and preparation of specimens. Basic sources of measurement errors.
10. Methods of X–ray spectrometry. X–ray fluorescent analysis (XRF). X-ray spectral microanalysis in scanning and transmission electron microscopy. Basic principles of wave length and energy dispersive analyses. Qualitative and quantitative X-ray spectral analyses. Detection limits.
11. Principle of optical emission spectrometry. Excitation by induction coupled plasma (ICP-OES), glow discharge (GDOES), spark, laser. Instrumentation of inorganic mass spectroscopy. Spectral interferences. Detection limits.
12. Mass spectrometry with induction coupled plasma (ICP-MS). Spectrometers. Mass spectrum and spectral interferences. Non-spectral interferences and signal drift. Detection limits.
13. Thermo-analytical methods – basic principles and classification. Thermo-evolution analytical methods.
14. Auger electron spectroscopy. Principles of scanning probe microscopy techniques: STM, ATM. Principles of ion field microscopy and atom probe tomography.
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction
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