653-3042/01 – Microscopy of nanostructures (MiNan)
| Gurantor department | Department of Materials Engineering and Recycling | Credits | 7 |
| Subject guarantor | doc. Ing. Anastasia Volodarskaja, Ph.D. | Subject version guarantor | doc. Ing. Anastasia Volodarskaja, Ph.D. |
| Study level | undergraduate or graduate | Requirement | Compulsory |
| Year | 1 | Semester | winter |
| | Study language | Czech |
| Year of introduction | 2023/2024 | Year of cancellation | |
| Intended for the faculties | FMT | Intended for study types | Follow-up Master |
Subject aims expressed by acquired skills and competences
The goal of this course is to expand students' knowledge in the field of electron microscopy and scanning probe microscopy and their use in the field of nanomaterials and nanotechnology.
Teaching methods
Lectures
Individual consultations
Tutorials
Experimental work in labs
Summary
Obsah předmětu je zaměřen na metody studia struktury materiálů a jejich chemického a fázového složení metodami transmisní a skenovací elektronové mikroskopie a mikroskopie rastrovací sondou. Předmět rozvíjí dosavadní znalosti studentů a zaměřuje se zejména na aplikace v oblasti nanomateriálů a nanotechnologií. Studenti budou hlouběji seznámeni nejen se zmíněnými zobrazovacími metodami, s principy získání a zpracování příslušných obrazových záznamů a instrumentací jednotlivých mikroskopů. Teoreticky se seznámí s přístrojovou technikou, pomůckami a postupy určenými pro správnou přípravu vzorků. Dále se seznámí s kombinovanými technikami a korelativní mikroskopií, tedy technikami, které kombinují různé druhy zobrazování s analytickými metodami. Veškeré informace budou studentům podávány ve vztahu k nanotechnologiím a dokládány příklady a konkrétními snímky nanočástic/nanomateriálů a aplikací v nanovědách.
Compulsory literature:
BONNELL, D. editor. Scanning Probe Microscopy and Spectroscopy. Theory, Techniques and Applications. Wiley-VCH, 2001.
WATT, I., M.: The Principles and Practice of Electron Microscopy. Cambridge University Press,1997.
Recommended literature:
Way of continuous check of knowledge in the course of semester
Continuous verification of learning outcomes:
full-time study form – 2 written tests, development of 3 protocols based on the task performed in practical exercises;
combined study form – 1 semestral project.
Final verification of study results: oral or written exam.
E-learning
LMS Moodle
Other requirements
For this subject other requirements for student are not determined.
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
-History of light microscopy. The principle of the light microscope. Preparation of samples. Examples of typical light metallography tasks.
-Discovery of the electron, history of electron microscopy. Wavelength, accelerating voltage, resolution, calculation of resolution and magnification of an electron microscope. The basic working principle of transmission and scanning electron microscopes.
-Vacuum systems of electron microscopes. Lighting system, types of electron sources. Imaging defects, chromatic aberration, astigmatism. Depth of sharpness. Electromagnetic lenses.
-Interaction of the primary electron beam with matter, types of collisions. Interpretation of images in secondary electrons (SE) and reflected electrons (BSE). SE and BSE detectors, phase (material) and topographic contrast, excitation volume. Charging the preparation and its elimination. Work in low vacuum mode.
-Basic principles of sample preparation for scanning electron microscopy. Preparation of thin layers, sputtering with metal, carbon. Instrumentation for the preparation of preparations. Artifacts.
-Scanning electron microscope. X-ray spectral microanalysis: wave dispersive and energy dispersive analysis. Line analysis and mapping. Spectroscopy of Auger electrons. Electron Backscattered Diffraction (EBSD). Scanning transmission electron microscope. Tabletop electron microscopes.
- Mechanisms of contrast formation in transmission electron microscopy: amplitude and phase contrast, Z contrast. Basic principles of kinematic and dynamic theory of electron scattering, contrast on crystal lattice defects.
-Preparation of preparations for transmission electron microscopy. High resolution transmission electron microscopy (HRTEM).
-Electron diffraction methods: selective electron diffraction and diffraction of a convergent electron beam. Interpretation of diffractograms obtained during the study of single crystals and polycrystals. EDX and EELS spectroscopic techniques.
-Interaction of ion beam with matter. Dual beam microscopes, use of focused ion beam (FIB) for preparation of preparations for electron microscopy. 3D EBSD.
-Connecting electron microscopy with atomic force microscopy. Correlative microscopy. Combination of electron microscopy with other analytical techniques (Raman spectroscopy, mass spectroscopy).
-Theoretical foundations of scanning probe microscopy (SPM) methods. Breakdown of individual SPM techniques. Basic structural elements of microscopes.
-Microscopic techniques AFM, STM, MFM. AP tomography.
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction
Předmět neobsahuje žádné hodnocení.