717-3710/02 – Optical spectroscopy (OS)
Gurantor department | Department of Physics | Credits | 4 |
Subject guarantor | doc. Dr. Mgr. Kamil Postava | Subject version guarantor | doc. Dr. Mgr. Kamil Postava |
Study level | undergraduate or graduate | Requirement | Choice-compulsory |
Year | 2 | Semester | winter |
| | Study language | Czech |
Year of introduction | 2016/2017 | Year of cancellation | 2019/2020 |
Intended for the faculties | USP | Intended for study types | Follow-up Master |
Subject aims expressed by acquired skills and competences
The main target is to deal with spectroscopic methods, which are used for characterization of bulk materials, thin films, and periuodic and composite materials. It is focused to optical spectroscipy methods, spectroscopic ellipsometry, and magneto-optical spectroscopic ellipsometry.
Teaching methods
Lectures
Summary
The lectures consist:
Physical principles of spectroscopic ellipsometry - electronic transitions and origin of spectral dependence of optical parameters, Kramers-Kronig dispersion relations.
Modelling of light propagation in spectroscopic system, matrix formalisms.
Optical spectroscopy of nanostructures - effective medium methods and their applications to nanostructured, nanocomposites, and porous materials.
Components of spectrometers and ellipsometers - sources, detectors, dispersion components, polarization optics.
Methods of spectroscopic data processing and fitting.
Reflection and transmission spectroscopy in visible near ultraviolet and near infrared spectral range, spectroscopic ellipsometry, FTIR spectrometry in mid and far infrared range, magneto=optic spectral elleipsometry, modern and advanced methods in spectrometry.
Compulsory literature:
FOX, M., Optical properties of solids, Oxford Univ. Press, 2003.
HOLLAS, J. M., Modern Spectroscopy (4th ed.), John Willey & Sons, 2009.
Recommended literature:
SVANBERG, S.: Atomic and molecular spectroscopy: basic aspects and practical applications, Springer-Verlag, Berlin 1991;
STENZEL, O., The physics of thin film optical spectra, Springer, Berlin, 2005;
PALIK, E. D., Handbook of optical constants of solids, Academic Press, New York, 1998;
OHLÍDAL, I., FRANTA, D.: Ellipsometry of thin film systems, In: Progress in Optics, Vol. 41, Ed. E. Wolf, 2000;
ZVEZDIN, A. K., KOTOV, V. A.: Modern magnetooptics and magnetooptical materials, IOP, Bristol 1977;
Way of continuous check of knowledge in the course of semester
E-learning
Other requirements
The lectures are terminated by an exam. The students understand spectroscopic methods used for study of bulk materials, thin films, and periodic and composit materials. It is focused to optical spectroscopy, spectroscopic ellipsometry, and magneto=optical spectroscopy.
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
Physical principles of spectroscopic ellipsometry - electronic transitions and origin of spectral dependence of optical parameters, Kramers-Kronig dispersion relations.
Modelling of light propagation in spectroscopic system, matrix formalisms.
Optical spectroscopy of nanostructures - effective medium methods and their applications to nanostructured, nanocomposites, and porous materials.
Components of spectrometers and ellipsometers - sources, detectors, dispersion components, polarization optics.
Methods of spectroscopic data processing and fitting.
Reflection and transmission spectroscopy in visible near ultraviolet and near infrared spectral range, spectroscopic ellipsometry, FTIR spectrometry in mid and far infrared range, magneto=optic spectral elleipsometry, modern and advanced methods in spectrometry.
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction
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