717-9019/01 – Optical Diagnostical Methods (ODM)

Gurantor departmentDepartment of PhysicsCredits10
Subject guarantordoc. RNDr. Petr Hlubina, CSc.Subject version guarantordoc. RNDr. Petr Hlubina, CSc.
Study levelpostgraduate
Study languageCzech
Year of introduction2016/2017Year of cancellation2018/2019
Intended for the facultiesHGF, FEI, USPIntended for study typesDoctoral
Instruction secured by
LoginNameTuitorTeacher giving lectures
HLU03 doc. RNDr. Petr Hlubina, CSc.
Extent of instruction for forms of study
Form of studyWay of compl.Extent
Full-time Examination 20+0
Combined Examination 20+0

Subject aims expressed by acquired skills and competences

Collect bases of optical diagnostic methods Describe, clarify and interpret up-to-date knowledge in this research field Apply modern approaches in solving the practice problems

Teaching methods

Lectures
Individual consultations

Summary

The subject Optical Diagnostic Methods belongs to the facultative subjects of the doctoral study programme Applied Physics. Within this subject, students will be systematically introduced to choice diagnostic methods of various waveguiding media and thin-film structures.

Compulsory literature:

Hariharan, P.: Optical Interferometry. Academic Press, New York, 1985. Mandel, L. - Wolf, E.: Optical Coherence and Quantum Optics. Cambridge University Press, Cambridge, 1995. Born, M. – Wolf, E.: Principles of Optics. Cambridge University Press, Cambridge, 1998. Snyder, A. – Love, J.: Optical Waveguide Theory. London: Chapman and Hall 1983. Marcuse, D.: Principles of Optical Fibre Measurements, Academic Press, New York 1981.

Recommended literature:

Leach, R.: Optical Measurement of Surface Topography, Springer, Berlin 2011.

Way of continuous check of knowledge in the course of semester

E-learning

Další požadavky na studenta

Systematic and independent work of a Ph.D. student is supposed

Prerequisities

Subject has no prerequisities.

Co-requisities

Subject has no co-requisities.

Subject syllabus:

1. Measurement of refractive index of isotropic and anisotropic media 1.1. Refractive index as characteristics of a medium. Phase and group refractive index, chromatic dispersion. 1.2. Kramers-Kroning dispersion relation. Semiempirical dispersion relation (Sellmeier, Cauchy, and so on). 1.3. Methods of measurement of phase and group refractive index. Fraunhoffer method, reflectometric methods, interferometric methods, ellipsometric methods. 1.4. Total refractometers (Abbe), Michelson, Mach-Zehnder and Rayleigh interferometer. Spectral ellipsometer. Fiber refractometers. 2. Measurement of dispersion of photonic crystal fibers 2.1. Material dispersion, vaweguiding and chromatic dispersion. Polarization mode dispersion, phase and group birefringence. 2.2. Theory of propagation of electromagnetic vawes in photonic crystal fibers. Modes and dispersion relation of modes. 2.3. Methods of measurement of dispersion of photonic crystal fibers. Time-domain method (time of flight), phase method, interferometric methods. 2.4. White-light spectral interferometry. Michelson interferometer (measurement of group birefringence). Mach-Zehnder interferometer (measurement of group and chromatic dispersion). Spectral method of measurement of phase birefringence. Polarimetric measurement of phase and group birefringence. 3. Optical reflectometry and ellipsometry 3.1. Fresnel relations. Complex reflection and transmission coefficients. Power reflection and transmission coefficients. Ellipsometric parameters. 3.2. Reflection of electromagnetic vawe from a thin film and multilayered film. Interferometric, reflectometric and ellipsometric determination of thin-film parameters. 3.3. Methods of measurement at normal incidence: spectral interferometry and reflectometry. 3.3. Methods of measurement at oblique incidence: spectral reflectometry and ellipsometry. 3.4. Commercial optical interferometers, reflectometers, ellipsometers. 4. Optical profilometry 4.1. Low-coherence optical profilometry. Spectral profilometry and profilometry with a light source of continuously varied wavelength. 4.2. Commercial optical profilometers.

Conditions for subject completion

Full-time form (validity from: 2016/2017 Winter semester, validity until: 2018/2019 Summer semester)
Task nameType of taskMax. number of points
(act. for subtasks)
Min. number of points
Examination Examination  
Mandatory attendence parzicipation:

Show history
Combined form (validity from: 2016/2017 Winter semester, validity until: 2018/2019 Summer semester)
Task nameType of taskMax. number of points
(act. for subtasks)
Min. number of points
Examination Examination  
Mandatory attendence parzicipation:

Show history

Occurrence in study plans

Academic yearProgrammeField of studySpec.FormStudy language Tut. centreYearWSType of duty
2018/2019 (P3942) Nanotechnology (3942V001) Nanotechnology K Czech Ostrava Choice-compulsory study plan
2017/2018 (P3942) Nanotechnology (3942V001) Nanotechnology P Czech Ostrava Choice-compulsory study plan
2017/2018 (P3942) Nanotechnology (3942V001) Nanotechnology K Czech Ostrava Choice-compulsory study plan
2017/2018 (P1701) Physics (1702V001) Applied Physics P Czech Ostrava Choice-compulsory study plan
2017/2018 (P1701) Physics (1702V001) Applied Physics K Czech Ostrava Choice-compulsory study plan
2017/2018 (P3942) Nanotechnology K Czech Ostrava Choice-compulsory study plan
2017/2018 (P1701) Physics (1702V001) Applied Physics K Czech Ostrava Choice-compulsory study plan
2016/2017 (P3942) Nanotechnology (3942V001) Nanotechnology P Czech Ostrava Choice-compulsory study plan
2016/2017 (P3942) Nanotechnology (3942V001) Nanotechnology K Czech Ostrava Choice-compulsory study plan
2016/2017 (P1701) Physics (1702V001) Applied Physics P Czech Ostrava Choice-compulsory study plan
2016/2017 (P1701) Physics (1702V001) Applied Physics K Czech Ostrava Choice-compulsory study plan
2016/2017 (P1701) Physics (1702V001) Applied Physics P Czech Ostrava Choice-compulsory study plan
2016/2017 (P1701) Physics (1702V001) Applied Physics K Czech Ostrava Choice-compulsory study plan

Occurrence in special blocks

Block nameAcademic yearForm of studyStudy language YearWSType of blockBlock owner