730-0143/01 – Scanning probe microscopy and electron microscopy (SPM+EM)

Gurantor department	Nanotechnology centre	Credits	3
Subject guarantor	doc. Ing. Vladimír Tomášek, CSc.	Subject version guarantor	doc. Ing. Vladimír Tomášek, CSc.
Study level	undergraduate or graduate	Requirement	Compulsory
Year	1	Semester	summer
		Study language	Czech
Year of introduction	2007/2008	Year of cancellation	2009/2010
Intended for the faculties	USP	Intended for study types	Follow-up Master

Instruction secured by
Login	Name	Tuitor	Teacher giving lectures
TOM24	doc. Ing. Vladimír Tomášek, CSc.

Extent of instruction for forms of study
Form of study	Way of compl.	Extent
Full-time	Credit and Examination	2+0

Subject aims expressed by acquired skills and competences

The goal is to extend actual knowledge of students in electron microscopy and scanning probe microscopy and their applications in nanomaterials and nanotechology sphere.

Teaching methods

Lectures

Summary

The content of subject is focused on the methods of structure materials study and their chemical and phase composition in micro- and nano- dimensions by transmission and scanning electron microscopy and scanning probe microscopy methods. The subject extend actual knowledge of students and parcicularly focuse on applications in nanomaterials and nanotechnology sphere.

Compulsory literature:

JONŠTA Z., VODÁREK V.: Strukturně fázová analýza II. Texty PGS, VŠB-TU Ostrava, 1999; JANDOŠ F., ŘÍMAN R.: Využití moderních laboratorních metod v metalografii,. SNTL, Praha, 1985; HULÍNSKÝ V., JUREK K.: Zkoumání látek elektronovým paprskem. SNTL, Praha, 1982; WATT, I., M.: The Principles and Practice of Electron Microscopy. Cambridge University Press; 1997, 484p. ISBN 0-521-43456-4; YAO, N., WANG, Z., L. (editors): Handbook of Microscopy for Nanotechnology. Kluwer Academic Publishers, 2005, 731p. ISBN 1-4020-8003-4; BONNELL, D. editor: Scanning Probe Microscopy and Spectroscopy, Theory, Techniques and Applications. Wiley-VCH, 2001, 512p. ISBN 0-471-24824-X; MEYER, E., HUG, H., J., BENNEWITZ, R.: Scanning Probe Microscopy, The Lab on a Tip. Springer, 2004, 210p. ISBN 3-540- 43180-2; KUBÍNEK, R., VŮJTEK, M., MAŠLÁŇ, M.: Mikroskopie Skenující Sondou. Vydavatelství PřF Olomouc, 2003, 145s. ISBN 80-244-0602-0.

Recommended literature:

Way of continuous check of knowledge in the course of semester

E-learning

Other requirements

Prerequisities

Subject has no prerequisities.

Co-requisities

Subject has no co-requisities.

Subject syllabus:

- Interakce elektronů s hmotou. - Základní typy elektronových mikroskopů. - Princip funkce transmisního elektronového mikroskopu. - Příprava vzorků pro transmisní elektronovou mikroskopii. - Princip funkce skenovacího elektronového mikroskopu.. - Analytické elektronové mikroskopy. - Interakce iontového svazku s materiálem. - Teoretické základy metod mikroskopie rastrovací sondou. (SPM). - Skenovací tunelovací mikroskopie (STM). - Mikroskopie atomárních sil (AFM). - Ostatní metody SPM.

Conditions for subject completion

Full-time form (validity from: 1960/1961 Summer semester, validity until: 2009/2010 Summer semester)

Task name	Type of task	Max. number of points (act. for subtasks)	Min. number of points	Max. počet pokusů
Exercises evaluation and Examination	Credit and Examination	100 (145)	51	3
Examination	Examination	100	0	3
Exercises evaluation	Credit	45	0	3

Mandatory attendence participation:

Show history

Conditions for subject completion and attendance at the exercises within ISP:

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Occurrence in study plans

Academic year	Programme	Branch/spec.	Form	Study language	Tut. centre	Year	Type of duty
2009/2010	(N3942) Nanotechnology	(3942T001) Nanotechnology	P	Czech	Ostrava	1	Compulsory	study plan
2008/2009	(N3942) Nanotechnology	(3942T001) Nanotechnology	P	Czech	Ostrava	1	Compulsory	study plan
2007/2008	(N3942) Nanotechnology	(3942T001) Nanotechnology	P	Czech	Ostrava	1	Compulsory	study plan

Occurrence in special blocks

Block name	Academic year	Form of study	Study language	Year	W	S	Type of block	Block owner

Assessment of instruction

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