730-0143/01 – Scanning probe microscopy and electron microscopy (SPM+EM)

Gurantor departmentNanotechnology centreCredits3
Subject guarantordoc. Ing. Vladimír Tomášek, CSc.Subject version guarantordoc. Ing. Vladimír Tomášek, CSc.
Study levelundergraduate or graduateRequirementCompulsory
Study languageCzech
Year of introduction2007/2008Year of cancellation2009/2010
Intended for the facultiesUSPIntended for study typesFollow-up Master
Instruction secured by
LoginNameTuitorTeacher giving lectures
TOM24 doc. Ing. Vladimír Tomášek, CSc.
Extent of instruction for forms of study
Form of studyWay of compl.Extent
Full-time Credit and Examination 2+0

Subject aims expressed by acquired skills and competences

The goal is to extend actual knowledge of students in electron microscopy and scanning probe microscopy and their applications in nanomaterials and nanotechology sphere.

Teaching methods



The content of subject is focused on the methods of structure materials study and their chemical and phase composition in micro- and nano- dimensions by transmission and scanning electron microscopy and scanning probe microscopy methods. The subject extend actual knowledge of students and parcicularly focuse on applications in nanomaterials and nanotechnology sphere.

Compulsory literature:

JONŠTA Z., VODÁREK V.: Strukturně fázová analýza II. Texty PGS, VŠB-TU Ostrava, 1999; JANDOŠ F., ŘÍMAN R.: Využití moderních laboratorních metod v metalografii,. SNTL, Praha, 1985; HULÍNSKÝ V., JUREK K.: Zkoumání látek elektronovým paprskem. SNTL, Praha, 1982; WATT, I., M.: The Principles and Practice of Electron Microscopy. Cambridge University Press; 1997, 484p. ISBN 0-521-43456-4; YAO, N., WANG, Z., L. (editors): Handbook of Microscopy for Nanotechnology. Kluwer Academic Publishers, 2005, 731p. ISBN 1-4020-8003-4; BONNELL, D. editor: Scanning Probe Microscopy and Spectroscopy, Theory, Techniques and Applications. Wiley-VCH, 2001, 512p. ISBN 0-471-24824-X; MEYER, E., HUG, H., J., BENNEWITZ, R.: Scanning Probe Microscopy, The Lab on a Tip. Springer, 2004, 210p. ISBN 3-540- 43180-2; KUBÍNEK, R., VŮJTEK, M., MAŠLÁŇ, M.: Mikroskopie Skenující Sondou. Vydavatelství PřF Olomouc, 2003, 145s. ISBN 80-244-0602-0.

Recommended literature:

Way of continuous check of knowledge in the course of semester


Other requirements


Subject has no prerequisities.


Subject has no co-requisities.

Subject syllabus:

- Interakce elektronů s hmotou. - Základní typy elektronových mikroskopů. - Princip funkce transmisního elektronového mikroskopu. - Příprava vzorků pro transmisní elektronovou mikroskopii. - Princip funkce skenovacího elektronového mikroskopu.. - Analytické elektronové mikroskopy. - Interakce iontového svazku s materiálem. - Teoretické základy metod mikroskopie rastrovací sondou. (SPM). - Skenovací tunelovací mikroskopie (STM). - Mikroskopie atomárních sil (AFM). - Ostatní metody SPM.

Conditions for subject completion

Full-time form (validity from: 1960/1961 Summer semester, validity until: 2009/2010 Summer semester)
Task nameType of taskMax. number of points
(act. for subtasks)
Min. number of points
Exercises evaluation and Examination Credit and Examination 100 (145) 51
        Examination Examination 100  0
        Exercises evaluation Credit 45  0
Mandatory attendence parzicipation:

Show history

Occurrence in study plans

Academic yearProgrammeField of studySpec.ZaměřeníFormStudy language Tut. centreYearWSType of duty
2009/2010 (N3942) Nanotechnology (3942T001) Nanotechnology P Czech Ostrava 1 Compulsory study plan
2008/2009 (N3942) Nanotechnology (3942T001) Nanotechnology P Czech Ostrava 1 Compulsory study plan
2007/2008 (N3942) Nanotechnology (3942T001) Nanotechnology P Czech Ostrava 1 Compulsory study plan

Occurrence in special blocks

Block nameAcademic yearForm of studyStudy language YearWSType of blockBlock owner