730-0143/01 – Scanning probe microscopy and electron microscopy (SPM+EM)
Gurantor department | Nanotechnology centre | Credits | 3 |
Subject guarantor | doc. Ing. Vladimír Tomášek, CSc. | Subject version guarantor | doc. Ing. Vladimír Tomášek, CSc. |
Study level | undergraduate or graduate | Requirement | Compulsory |
Year | 1 | Semester | summer |
| | Study language | Czech |
Year of introduction | 2007/2008 | Year of cancellation | 2009/2010 |
Intended for the faculties | USP | Intended for study types | Follow-up Master |
Subject aims expressed by acquired skills and competences
The goal is to extend actual knowledge of students in electron microscopy and scanning probe microscopy and their applications in nanomaterials and nanotechology sphere.
Teaching methods
Lectures
Summary
The content of subject is focused on the methods of structure materials study and their chemical and phase composition in micro- and nano- dimensions by transmission and scanning electron microscopy and scanning probe microscopy methods. The subject extend actual knowledge of students and parcicularly focuse on applications in nanomaterials and nanotechnology sphere.
Compulsory literature:
Recommended literature:
Way of continuous check of knowledge in the course of semester
E-learning
Other requirements
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
- Interakce elektronů s hmotou.
- Základní typy elektronových mikroskopů.
- Princip funkce transmisního elektronového mikroskopu.
- Příprava vzorků pro transmisní elektronovou mikroskopii.
- Princip funkce skenovacího elektronového mikroskopu..
- Analytické elektronové mikroskopy.
- Interakce iontového svazku s materiálem.
- Teoretické základy metod mikroskopie rastrovací sondou. (SPM).
- Skenovací tunelovací mikroskopie (STM).
- Mikroskopie atomárních sil (AFM).
- Ostatní metody SPM.
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction
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