9360-0011/01 – X-ray Diffraction Analysis (RDA)
| Gurantor department | CNT - Nanotechnology Centre | Credits | 6 |
| Subject guarantor | doc. Mgr. Kateřina Mamulová Kutláková, Ph.D. | Subject version guarantor | doc. Mgr. Kateřina Mamulová Kutláková, Ph.D. |
| Study level | undergraduate or graduate | Requirement | Compulsory |
| Year | 2 | Semester | summer |
| | Study language | Czech |
| Year of introduction | 2007/2008 | Year of cancellation | 2018/2019 |
| Intended for the faculties | FMT | Intended for study types | Follow-up Master |
Subject aims expressed by acquired skills and competences
The course introduces students to basic concepts of crystallochemistry and X-ray Diffraction Analysis.
Teaching methods
Lectures
Tutorials
Experimental work in labs
Summary
Obsah předmětu je zaměřen především na detailnější poznatky o metodách rtg.
difrakční analýzy, ale je doplněn také současnými poznatky o krystalických
látkách, které jsou zmíněnými metodami analyzovány. Je rozdělen do
následujících tématických okruhů: Krystal, krystalová struktura, krystalová
mřížka, symetrie uspořádání struktur, atomová struktura krystalů, rentgenové
záření, teorie difrakce, rentgenografické difrakční metody, kvalitativní a
kvantitativní analýza, určování mřížkových parametrů, vliv neuspořádanosti
struktury a velikosti krystalů na difrakční obraz, praktické aplikace analýzy
materiálů uvedenými metodami.
Compulsory literature:
Frank H. Chung and Deane K. Smith: Industrial Applications of X-Ray Diffraction, Taylor & Francis Group, 2000. ISBN: 0-8247-1992-1
Recommended literature:
BISH, D. L., POST, J. E.: Eds. Modern Powder Diffraction, Reviews in
Miner.Vol. 20, Washington, D.C., 1989.
BLOSS, F. D: Crystallography and Crystal, Chemistry.- Holt, Rinehart and
Winston, Inc., 1971.
Additional study materials
Way of continuous check of knowledge in the course of semester
E-learning
Other requirements
For this subject are not the requirements for the student.
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
Content
1. Introduction- history, basic terms (definition of crystal, lattice types, Miller's indexes, crystallographic systems, minimal symmetry rules, reciprocal lattice).
2. Point symmetry, stereographic projection.
3. Group theory, crystallographic group of symmetry, symbols.
4. Matrix representation of symmetry operations.
5. Space group of symmetry; symbols, graphical illustration.
6. Crystallochemistry, crystallization processes, types of structure defects, crystal structure and chemical bond.
7. X-ray; principle, formation, forms, properties, registration, interaction with matter.
8. Diffraction of X-rays; Laue and Bragg equations; structural factor F (hkl).
9. X-ray diffraction methods, classification based on Ewald's scheme, Laue, Debye Scherrer, powder methods.
10. Powder diffractometers, indexation of powder patterns records, focusing methods, practical applications of powder methods.
11. Single crystal techniques; Weissenberg and precession method, types of diffractometers, complete X-ray analysis of crystal compounds.
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction