9360-0132/03 – Laboratory Practice from Experimetnal Methods of Nanomaterials Study I (LPEM)
| Gurantor department | CNT - Nanotechnology Centre | Credits | 3 |
| Subject guarantor | doc. Mgr. Kateřina Mamulová Kutláková, Ph.D. | Subject version guarantor | doc. Mgr. Kateřina Mamulová Kutláková, Ph.D. |
| Study level | undergraduate or graduate | Requirement | Compulsory |
| Year | 3 | Semester | summer |
| | Study language | Czech |
| Year of introduction | 2012/2013 | Year of cancellation | |
| Intended for the faculties | USP, FMT | Intended for study types | Bachelor |
Subject aims expressed by acquired skills and competences
Students will try different experimental techniques of nanomaterials study (SEM, EMA, AFM, XRD, chromatography, IR spectrometry, Raman spectrometry) in practice.
Teaching methods
Seminars
Experimental work in labs
Summary
Students will try different experimental techniques of nanomaterials study (SEM, EMA, AFM, XRD, chromatography, IR spectrometry, Raman spectrometry) in practice
Compulsory literature:
WATT, I,. M.: The principles and practice of electron microscopy. Cambridge University Press, 1997.
JENKINS, R., SNYDER, R. L. Introduction to X-ray Powder Diffractometry. J.Wiley & Sons, 1996.
BONNELL, D. editor: Scanning Probe Microscopy and Spectroscopy, Theory, Techniques and Applications. Wiley-VCH, 2001.
Recommended literature:
Way of continuous check of knowledge in the course of semester
Oral. Passing of the exercises and evaluation of results, submission of reports on individual laboratory tasks.
E-learning
Other requirements
For this subject other requirements for student are not determined.
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
1. Sample preparation for chromatography. Extraction, SPE, SPME, thermal dessorpion, headspace analysis.
2. Gas chromatography. Analysis of gas and BTEX, calibration, determination of basic parameters of separation.
3. Liquid chromatography. Analysis of anions. Calibration, determination of basic parameters of separation.
Dectors on the basis of mass spectrometry. determination of structural compound formula on the basis of mass spectrum.
5. Identifying of asbestos using SEM + EMA method:
a) analysis of morphology and chemical composition of asbestos and other fibrous materials
b) analysis of an unknown sample of fibrous material, confirm or refute the presence of asbestos
6. Measuring of topography of semiconductor grid sample
a) in contact mode
b) in semi contact mode
7. Powder X-ray diffraction:
a) measuring diffraction of powdered sample on the Si plate
b) evaluation of diffraction record, identifying of compounds
8. Thermal analysis, evaluation of TG and DTA curves.
9. Infrared spectrometry
10 Raman spectrometry.
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction