9360-0140/01 – Methods of structure and phase analysis of nanomaterials (STRAN)
| Gurantor department | CNT - Nanotechnology Centre | Credits | 3 |
| Subject guarantor | doc. Mgr. Kateřina Mamulová Kutláková, Ph.D. | Subject version guarantor | doc. Mgr. Kateřina Mamulová Kutláková, Ph.D. |
| Study level | undergraduate or graduate | Requirement | Compulsory |
| Year | 1 | Semester | winter |
| | Study language | Czech |
| Year of introduction | 2010/2011 | Year of cancellation | 2019/2020 |
| Intended for the faculties | USP | Intended for study types | Follow-up Master |
Subject aims expressed by acquired skills and competences
The use of diffraction methods (X-ray, electron, neutron, synchrotron radiation) for structure and phase analysis of nanomaterials.
Teaching methods
Lectures
Individual consultations
Experimental work in labs
Summary
Crystallochemistry and structures in solids. Structures of crystallic, amorphous and mesomorphous phases. Modern methods of solid state characterisation. In materials research, the scientist has many analytical questions related to the crystalline constitution of material samples. X-ray diffraction is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use X-ray diffraction to analyze a wide range of materials, from powders and thin films to nanomaterials and solid objects.
Compulsory literature:
Recommended literature:
Additional study materials
Way of continuous check of knowledge in the course of semester
E-learning
Other requirements
For this subject are not the requirements for the student.
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
1. Introduction- history, basic terms (definition of crystal, lattice types, Miller's indexes, crystallographic systems, minimal symmetry rules, reciprocal lattice).
2. Point symmetry, stereographic projection.
3. Group theory, crystallographic group of symmetry, symbols.
4. Matrix representation of symmetry operations.
5. Space group of symmetry; symbols, graphical illustration.
6. Crystallochemistry, crystallization processes, types of structure defects, crystal structure and chemical bond.
7. X-ray; principle, formation, forms, properties, registration, interaction with matter.
8. Diffraction of X-rays; Laue and Bragg equations; structural factor F (hkl).
9. X-ray diffraction methods, classification based on Ewald's scheme, Laue, Debye Scherrer, powder methods.
10. Powder diffractometers, indexation of powder patterns records, focusing methods, practical applications of powder methods.
11. Single crystal techniques; Weissenberg and precession method, types of diffractometers, complete X-ray analysis of crystal compounds.
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction