9360-0140/03 – Methods of structure and phase analysis of nanomaterials (STRAN)

Gurantor departmentCNT - Nanotechnology CentreCredits4
Subject guarantorMgr. Kateřina Mamulová Kutláková, Ph.D.Subject version guarantorMgr. Kateřina Mamulová Kutláková, Ph.D.
Study levelundergraduate or graduateRequirementCompulsory
Study languageCzech
Year of introduction2019/2020Year of cancellation
Intended for the facultiesFMT, USPIntended for study typesFollow-up Master
Instruction secured by
LoginNameTuitorTeacher giving lectures
CAP01 prof. RNDr. Pavla Čapková, DrSc.
MAM02 Mgr. Kateřina Mamulová Kutláková, Ph.D.
MAT27 doc. Ing. Vlastimil Matějka, Ph.D.
Extent of instruction for forms of study
Form of studyWay of compl.Extent
Full-time Credit and Examination 2+1

Subject aims expressed by acquired skills and competences

The use of diffraction methods (X-ray, electron, neutron, synchrotron radiation) for structure and phase analysis of nanomaterials.

Teaching methods

Individual consultations
Experimental work in labs


Crystallochemistry and structures in solids. Structures of crystallic, amorphous and mesomorphous phases. Modern methods of solid state characterisation. In materials research, the scientist has many analytical questions related to the crystalline constitution of material samples. X-ray diffraction is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use X-ray diffraction to analyze a wide range of materials, from powders and thin films to nanomaterials and solid objects.

Compulsory literature:

DE GRAEF, Marc a Michael E MCHENRY. Structure of materials: an introduction to crystallography, diffraction and symmetry. 2nd ed., fully rev. and updated. New York: Cambridge University Press, 2012. ISBN 978-1-107-00587-7. CHUNG, Frank H a Deane Kingsley SMITH, ed. Industrial applications of X-ray diffraction. New York: Marcel Dekker, c2000. ISBN 0-8247-1992-1. GIACOVAZZO, Carmelo. Fundamentals of crystallography. Oxford: Oxford University Press, c1992. ISBN 0-19-855579-2.

Recommended literature:

GLUSKER, Jenny Pickworth a Kenneth N TRUEBLOOD. Crystal structure analysis: a primer. 2nd ed. New York: Oxford University Press, 1985. ISBN 0-19-503531-3.

Way of continuous check of knowledge in the course of semester

Presentation. Exam consists of a written and oral part.


Other requirements

For this subject are not the requirements for the student.


Subject has no prerequisities.


Subject has no co-requisities.

Subject syllabus:

1. Introduction- history, basic terms. Definition of crystal, lattice types, Miller indexes, crystallographic systems, minimal symmetry rules, reciprocal lattice. 2. Point symmetry, stereographic projection. 3. Group theory, crystallographic group of symmetry, symbols. 4. Matrix representation of symmetry operations. 5. Space group of symmetry, symbols, graphical illustration. 6. Crystallochemistry, crystallization processes, types of structure defects, crystal structure and chemical bond. 7. Ionic crystals. Molecules and molecular crystals. Physical properties of crystals. 8. X-ray. Principle, formation, forms, properties, registration, interaction with matter. 9. Diffraction of X-rays. Laue and Bragg equations. Structural factor. 10. X-ray diffraction methods, classification based on the Ewald construction, Laue, Debye Scherrer, powder methods. 11. Powder diffractometers, indexation of powder patterns records, focusing methods, practical applications of powder methods. 12. Monocrystallic diffraction methods. 13. Single crystal techniques. Weissenberg and precession method, types of diffractometers, complete X-ray analysis of crystal compounds. 14. Rietveld method of quantitative phase analysis and its practical usage.

Conditions for subject completion

Full-time form (validity from: 2019/2020 Winter semester)
Task nameType of taskMax. number of points
(act. for subtasks)
Min. number of points
Credit and Examination Credit and Examination 100 (100) 51
        Credit Credit  
        Examination Examination 100  51
Mandatory attendence parzicipation: You need 80% attendance to sit for your final exam. You need to apply for your sick leave. If you have only 50% attendance, you will be barred from final exam.

Show history

Occurrence in study plans

Academic yearProgrammeField of studySpec.ZaměřeníFormStudy language Tut. centreYearWSType of duty
2020/2021 (N0719A270002) Nanotechnology MPC P Czech Ostrava 1 Compulsory study plan
2019/2020 (N0719A270002) Nanotechnology MPC P Czech Ostrava 1 Compulsory study plan

Occurrence in special blocks

Block nameAcademic yearForm of studyStudy language YearWSType of blockBlock owner