9360-0143/02 – Scanning probe microscopy and electron microscopy (SPM+EM)
| Gurantor department | CNT - Nanotechnology Centre | Credits | 3 |
| Subject guarantor | doc. Ing. Vladimír Tomášek, CSc. | Subject version guarantor | doc. Ing. Vladimír Tomášek, CSc. |
| Study level | undergraduate or graduate | Requirement | Compulsory |
| Year | 1 | Semester | summer |
| | Study language | Czech |
| Year of introduction | 2013/2014 | Year of cancellation | 2019/2020 |
| Intended for the faculties | USP | Intended for study types | Follow-up Master |
Subject aims expressed by acquired skills and competences
The goal is to extend actual knowledge of students in electron microscopy and scanning probe microscopy and their applications in nanomaterials and nanotechnology sphere.
Teaching methods
Lectures
Summary
The content of the subject is focused on the methods of materials structure study and their chemical and phase composition by transmission and scanning electron microscopy and scanning probe microscopy methods. The subject extend actual knowledge of students and parcicularly focuse on applications in nanomaterials and nanotechnology sphere. Students will be acquainted with the above mentioned imaging methods, with the principles of obtaining and processing of relevant image recordings and instrumentation of individual microscopes. Theoretically, they will acquaint themselves with instrumentation, aids and procedures for correct preparation of samples. They will also learn about combined techniques and correlative microscopy, it means techniques that combine different types of imaging with analytical methods. All information will be provided to students in relation to nanotechnologies and examples and specific images of nanoparticles / nanomaterials and applications in nanosciences will be documented.
Compulsory literature:
Recommended literature:
WILLIAMS D. B. Practical Analytical Electron Microscopy in Materials Science. Verlag Chemie International, 1984.
KRATOŠOVÁ, Gabriela, Kateřina DĚDKOVÁ, Ivo VÁVRA a Fedor ČIAMPOR. Investigation of nanoparticles in biological objects by electron microscopy techniques. In: Intracellular Delivery II: Fundamentals and Applications (Eds: Aleš Prokop, Y. Iwasaki, A. Harada), Springer Verlag, 2014.
Additional study materials
Way of continuous check of knowledge in the course of semester
E-learning
Other requirements
For this subject other requirements for student are not determined.
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
- Interaction of electrons with matter
- Basic types of electron microscopes
- Function principle of transmition electron microscope
- Sample preparation for transmition electron microscopy
- Function principle of scanning electron microscope
- Analytical electron microscopes
- Interaction of ion beam with matter
- Theoretical background in the field of scanning probe microscopy
- Scanning tunneling microscopy
- Atomic force microscopy
- Other techniques of scanning probe microscopy
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction