9360-0144/03 – Laboratory practice in microscopy (LCM)

Gurantor departmentCNT - Nanotechnology CentreCredits2
Subject guarantordoc. Ing. Vladimír Tomášek, CSc.Subject version guarantordoc. Ing. Vladimír Tomášek, CSc.
Study levelundergraduate or graduateRequirementCompulsory
Year1Semestersummer
Study languageCzech
Year of introduction2019/2020Year of cancellation
Intended for the facultiesFMT, USPIntended for study typesFollow-up Master
Instruction secured by
LoginNameTuitorTeacher giving lectures
DRO105 Ing. Klára Drobíková, Ph.D.
HEL64 Marie Heliová
KOZ032 Ing. Světlana Kozubová
STE17 Ing. Gabriela Kratošová, Ph.D.
MAT27 doc. Ing. Vlastimil Matějka, Ph.D.
TOM24 doc. Ing. Vladimír Tomášek, CSc.
VAC121 Ing. Miroslav Vaculík, Ph.D.
Extent of instruction for forms of study
Form of studyWay of compl.Extent
Full-time Graded credit 0+2

Subject aims expressed by acquired skills and competences

The goal is to practice application of electron microscopy and scanning probe microscopy methods including samples preparation and results evaluation.

Teaching methods

Seminars
Experimental work in labs

Summary

The subject follow up the lectures on scanning probe microscopy and electron microscopy. Applications of the methods (electron microscopy and microanalysis, AFM) will be practiced. Problems of chemical, structure and phase analysis of materials in micro- and nano- dimensions will be solved. Attention will be focused also on the samples preparation, results evaluation and interpretation of the results in nanotechnology.

Compulsory literature:

Study materials for laboratory practices. YAO, Nan, WANG, Zhong Lin. Handbook of Microscopy for Nanotechnology. Springer US, 2005. ISBN 978-1-4020-8003-6.

Recommended literature:

WATT, I. M. The Principles and Practice of Electron Microscopy. Cambridge University Press, 1997. BONNELL, D editor. Scanning Probe Microscopy and Pectroscopy, Theory, Techniques and Application. Wiley-VCH, 2001.

Way of continuous check of knowledge in the course of semester

Oral. Passing of the exercises and evaluation of results, submission of reports on individual laboratory tasks.

E-learning

Other requirements

For this subject other requirements for student are not determined.

Prerequisities

Subject has no prerequisities.

Co-requisities

Subject has no co-requisities.

Subject syllabus:

1. Introduction to optical microscopy, sample preparation. Digital imaging and 3D mapping options. 2. Sample Preparation for Scanning Electron Microscopy (SEM) - Preparation of powder, piece and non-conductive specimens on discs. Fixing samples on a table in an electron microscope chamber. Applying a conductive layer, grounding the sample. 3. Imaging in secondary and backscattered electrons. Demonstration of phase and topographic contrast on suitable preparations (2-3 practical exercises). 4. Sample preparation for transmission electron microscopy (TEM). Excursion to TEM workplace in VŠB - TUO. 5. X-ray microanalysis - analysis of the chemical composition of the sample. Point analysis, mapping. Evaluation of the EDS record. 6. Analysis of own samples. Students will bring their own preparation for the analysis of morphology and chemical composition. 7. Sample Preparation for Scanning Transmission Electron Microscopy (STEM). Preparation of samples on the nets. 8. Analysis of size distribution of nanoparticles from TEM record using available software. 9. Excursions to FEI - Thermo Fisher Sci, Tescan. 10. Computational practice, examples of electron microscopy problematic. 11. Sample measurement by AFM in contact mode. Measurement of semiconductors and micropicks on the steel surface. Determination of roughness and height of puncture. 12. Sample measurement by AFM in non-contact (semi-contact)mode. Size and shape determination of powder samples (phyllo-silicates, oxides). 13. Sample measurement by AFM - MFM two - phase method. Determination of magnetic properties of solid samples. 14. Evaluation and editing of data obtained from the AFM. Evaluation and editing data using Image Analysis and Gwyddion software\'s.

Conditions for subject completion

Full-time form (validity from: 2018/2019 Winter semester)
Task nameType of taskMax. number of points
(act. for subtasks)
Min. number of points
Graded credit Graded credit 100  51
Mandatory attendence parzicipation: Passing practical laboratory exercises. Evaluation of the results of the laboratory tests and submission of required records of the tests carried out.

Show history

Occurrence in study plans

Academic yearProgrammeField of studySpec.ZaměřeníFormStudy language Tut. centreYearWSType of duty
2021/2022 (N0719A270002) Nanotechnology P Czech Ostrava 1 Compulsory study plan
2020/2021 (N0719A270002) Nanotechnology P Czech Ostrava 1 Compulsory study plan
2019/2020 (N0719A270002) Nanotechnology P Czech Ostrava 1 Compulsory study plan

Occurrence in special blocks

Block nameAcademic yearForm of studyStudy language YearWSType of blockBlock owner