9360-0144/04 – Laboratory practice in microscopy (LCM)
| Gurantor department | CNT - Nanotechnology Centre | Credits | 2 |
| Subject guarantor | doc. Ing. Vladimír Tomášek, CSc. | Subject version guarantor | doc. Ing. Vladimír Tomášek, CSc. |
| Study level | undergraduate or graduate | Requirement | Compulsory |
| Year | 1 | Semester | summer |
| | Study language | English |
| Year of introduction | 2019/2020 | Year of cancellation | |
| Intended for the faculties | FMT, USP | Intended for study types | Follow-up Master |
Subject aims expressed by acquired skills and competences
The goal is to practice application of electron microscopy and scanning probe microscopy methods including samples preparation and results evaluation.
Teaching methods
Seminars
Experimental work in labs
Summary
The subject follow up the lectures on scanning probe microscopy and electron microscopy. Applications of the methods (electron microscopy and microanalysis, AFM) will be practiced. Problems of chemical, structure and phase analysis of materials in micro- and nano- dimensions will be solved. Attention will be focused also on the samples preparation, results evaluation and interpretation of the results in nanotechnology.
Compulsory literature:
Recommended literature:
WATT, I. M. The Principles and Practice of Electron Microscopy. Cambridge University Press, 1997.
BONNELL, D editor. Scanning Probe Microscopy and Pectroscopy, Theory, Techniques and Application. Wiley-VCH, 2001.
Additional study materials
Way of continuous check of knowledge in the course of semester
Oral. Passing of the exercises and evaluation of results, submission of reports on individual laboratory tasks.
E-learning
Other requirements
For this subject other requirements for student are not determined.
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
1. Introduction to optical microscopy, sample preparation. Digital imaging and 3D mapping options.
2. Sample Preparation for Scanning Electron Microscopy (SEM) - Preparation of powder, piece and non-conductive specimens on discs. Fixing samples on a table in an electron microscope chamber. Applying a conductive layer, grounding the sample.
3. Imaging in secondary and backscattered electrons. Demonstration of phase and topographic contrast on suitable preparations (2-3 practical exercises).
4. Sample preparation for transmission electron microscopy (TEM). Excursion to TEM workplace in VŠB - TUO.
5. X-ray microanalysis - analysis of the chemical composition of the sample. Point analysis, mapping. Evaluation of the EDS record.
6. Analysis of own samples. Students will bring their own preparation for the analysis of morphology and chemical composition.
7. Sample Preparation for Scanning Transmission Electron Microscopy (STEM). Preparation of samples on the nets.
8. Analysis of size distribution of nanoparticles from TEM record using available software.
9. Excursions to FEI - Thermo Fisher Sci, Tescan.
10. Computational practice, examples of electron microscopy problematic.
11. Sample measurement by AFM in contact mode. Measurement of semiconductors and micropicks on the steel surface. Determination of roughness and height of puncture.
12. Sample measurement by AFM in non-contact (semi-contact)mode. Size and shape determination of powder samples (phyllo-silicates, oxides).
13. Sample measurement by AFM - MFM two - phase method. Determination of magnetic properties of solid samples.
14. Evaluation and editing of data obtained from the AFM. Evaluation and editing data using Image Analysis and Gwyddion software\'s.
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction