9360-0211/01 – Special Methods of Analytical Chemistry (SMACH)
| Gurantor department | CNT - Nanotechnology Centre | Credits | 10 |
| Subject guarantor | doc. Ing. Vladimír Tomášek, CSc. | Subject version guarantor | doc. Ing. Vladimír Tomášek, CSc. |
| Study level | postgraduate | Requirement | Choice-compulsory |
| Year | | Semester | winter + summer |
| | Study language | Czech |
| Year of introduction | 2012/2013 | Year of cancellation | |
| Intended for the faculties | USP | Intended for study types | Doctoral |
Subject aims expressed by acquired skills and competences
Students become more familiar with the methods of chemical analysis of materials with a focus on the analysis of nanomaterials. Attention will be paid to the chosen spectral methods. Methods of X-ray spectral analysis, electron spectroscopy and emission spectral analysis with glow discharge for the analysis of very thin layers will be discussed. There will also be introduced to methods of spectral analysis in combination with electron microscopes and Raman spectroscopy in combination with a microscope.
Teaching methods
Individual consultations
Summary
Compulsory literature:
1. J. Kenkel, Analytical Chemistry for Technicians, Third Edition, CRC 2002.
2. R. Tertian, F. Claisse, Priciples of Quantitative X-Ray Fluorescence Analysis, Hayden & son Ltd, London 1982.
Recommended literature:
1. E. P. Bertin, Principles and Practice of X-Ray Spectrometric Analysis, Plenum Press, New York - London 1975.
2. D. B. Williams, Practical Analytical Electron Microscopy in Materials Science, Verlag chemie international, Florida - Basel 1984.
3. N. Yao, Z. L. Wang (Eds.), Handbook of microscopy for nanotechnology, Kluwer Acadenic Publishers, Boston 2005.
Way of continuous check of knowledge in the course of semester
E-learning
Other requirements
Write a seminar work. Topic of the seminar work is defined by supervisor.
Prerequisities
Subject has no prerequisities.
Co-requisities
Subject has no co-requisities.
Subject syllabus:
1. Spectral methods of analytical chemistry
Atomic emission spectrometry (excitation by spark, glow discharge, ICP), optical spectrometry, mass spectrometry
Atomic absorption spectrometry (flame and electro thermal atomization, gaseous hydrides method)
X-ray spectral analysis, X-ray fluorescence spectrometry (XRF), XRF with focused X-ray beam, total reflection method, grazing method
Electron spectroscopy (XPS, AES)
Molecular absorption analysis, UV/VIS spectrometry, infrared spectrometry, Raman spectrometry, Raman microscopy
2. Electrochemical methods.
Conductometry, conductometric titrations
Potentiometry, ion selective electrodes, potentiometric titration
Electrolytical methods, voltammetry (polarography), new voltammetric methods, coulometry
Electromigration separation methods, capillary electrophoresis, isotachophoresis
3. Analytical electron microscopy (AEM)
Basics of electron microscopy, interaction of electron beam with matter and basic components of electron microscopes
Transmition electron microscopy (TEM), scanning electron microscopy (SEM), scanning transmition electron microscopy (STEM)
X-ray spectral microanalysis, Auger electrons spectrometry
Electron energy loss spectrometry (EELS)
Focused ion beam (FIB), manipulation with sample in nano - scale
Conditions for subject completion
Occurrence in study plans
Occurrence in special blocks
Assessment of instruction
Předmět neobsahuje žádné hodnocení.