9360-0224/01 – Optical Spectroscopy and Ellipsometry of nanostructures (OSEN)

Gurantor departmentCNT - Nanotechnology CentreCredits10
Subject guarantordoc. Dr. Mgr. Kamil PostavaSubject version guarantordoc. Dr. Mgr. Kamil Postava
Study levelpostgraduateRequirementChoice-compulsory
YearSemesterwinter
Study languageCzech
Year of introduction2018/2019Year of cancellation
Intended for the facultiesFMT, USPIntended for study typesDoctoral
Instruction secured by
LoginNameTuitorTeacher giving lectures
POS40 doc. Dr. Mgr. Kamil Postava
Extent of instruction for forms of study
Form of studyWay of compl.Extent
Full-time Examination 0+0
Combined Examination 0+0

Subject aims expressed by acquired skills and competences

The subject is focused on methods of optical spectroscopies used for study of thin films and nanostructures periodic and composite materials. It is focused on physical principles, measurement methods, measured data processing, and specific aspects of surfaces, nanoparticles of periodic systems and effective media. The subject includes transmission and reflection spectroscopy, spectroscopic ellipsometry, infrared spectroscopy, and magneto-optical spectroscopic ellipsometry.

Teaching methods

Lectures
Seminars
Individual consultations

Summary

1. Physical principles of optical spectroscopy and ellipsometry; electron transitions and origin of spectral dependence of optical parameters; modeling of material dielectric functions; Kramers-Kronig dispersion relations, absorption and dispersion; spectral devices (dispersion prism, gratings, Fabry-Perot interferometer); optics of thin films, methods of effective medium and their application in optical spectroscopy 2. Reflection and transmission spectroscopy in visible, near-uv, and near ir range; components of spectrometer, double beam spectrometers, materials used in optical spectroscopy, spectral resolution and instrument function of monochromator; accessories, integration sphere 3. Spectroscopic ellipsometry; ellipsometric methods, measurement of psi and delta, generalized ellipsometry, Mueller matrix polarimetry; ellipsometers (null, polarization modulation, rotating analyzer, and rotating compensator), averaging methods and errors comepensation 4. Spectroscopy in mid infrared spectral range origin of infrared spectra, vibration and rotation spectroscopy, principles of Fourier transform infrared spectrometer (FTIR), interferogram treatment, special methods - ATR, IRRAS, modelling of absorption peaks, chemical analysis 5. Magneto-optical spectroscopy origin of magneto-optical effects, Kerr, Faraday, and Voight magneto-optic effect, effect of magnetization direction on magneto-optical effects, specific aspects of magneto-optical ellipsometers 6. Modern and additional methods of optical spectroscopy emission spectroscopy, laser spectroscopy, photoluminiscence and fluorescence spectra, Raman spectroscopy, time-resolve spectroscopy, diffraction of periodic grating structures

Compulsory literature:

S. Svanberg, Atomic and molecular spectroscopy: basic aspects and practical applications, Springer-Verlag, Berlin 1991. R. M. A. Azzam, N. M. Bashara, Ellipsometry and polarized light, North-Holland, Amsterdam 1977. H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications, John Wiley & Sons 2007. P. Griffiths, J. A. De Haseth, Fourier Transform Infrared Spectrometry (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications), Wiley 2nd. Ed, 2007.

Recommended literature:

O. Stenzel, The physics of thin film optical spectra, Springer 2005. P.Y. You and M. Cardona, Fundamentals of semiconductors, 3rd Ed, Springer 2010. I. Ohlídal, D. Franta, Ellipsometry of thin film systems, In: Progress in Optics, Vol. 41, Ed. E. Wolf, 2000. H. Tompkins and E. Irene, Handbook of Ellipsometry, William Andrew 2005. D. S. Kliger, J. W. Lewis, C. E. Randall, Polarized light in optics and spectroscopy, Academic Press, New York 1990.

Way of continuous check of knowledge in the course of semester

tutorials, examination

E-learning

Další požadavky na studenta

Understand principles of fundamental methods of optical spectroscopies used for study of thin films and nanostructures, periodic and composite materials. It is focused on physical principles, measurement methods, measured data processing, and specific aspects of surfaces, nanoparticles of periodic systems, and effective media. It includes transmission and reflection spectroscopy, spectroscopic ellipsometry, infrared spectroscopy, and magneto-optical spectroscopic ellipsometry.

Prerequisities

Subject has no prerequisities.

Co-requisities

Subject has no co-requisities.

Subject syllabus:

1. Physical principles of optical spectroscopy and ellipsometry; electron transitions and origin of spectral dependence of optical parameters; modeling of material dielectric functions; Kramers-Kronig dispersion relations, absorption and dispersion; spectral devices (dispersion prism, gratings, interferometers); optics of thin films, methods of effective medium and their application in optical spectroscopy 2. Reflection and transmission spectroscopy in visible, near-uv, and near ir range; components of spectrometer, double beam spectrometers, materials used in optical spectroscopy, spectral resolution and instrument function of monochromator; accessories, integration sphere 3. Spectroscopic ellipsometry; ellipsometric methods, measurement of psi and delta, generalized ellipsometry, Mueller matrix polarimetry; ellipsometers (null, polarization modulation, rotating analyzer, and rotating compensator), averaging methods and errors comepensation 4. Spectroscopy in mid infrared spectral range origin of infrared spectra, vibration and rotation spectroscopy, principles of Fourier transform infrared spectrometer (FTIR), interferogram treatment, special methods - ATR, IRRAS, modelling of absorption peaks, chemical analysis 5. Magneto-optical spectroscopy origin of magneto-optical effects, Kerr, Faraday, and Voight magneto-optic effect, effect of magnetization direction on magneto-optical effects, specific aspects of magneto-optical ellipsometers 6. Modern and additional methods of optical spectroscopy emission spectroscopy, laser spectroscopy, photoluminiscence and fluorescence spectra, Raman spectroscopy, time-resolve spectroscopy, diffraction of periodic grating structures

Conditions for subject completion

Combined form (validity from: 2018/2019 Winter semester)
Task nameType of taskMax. number of points
(act. for subtasks)
Min. number of points
Examination Examination  
Mandatory attendence parzicipation:

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Occurrence in study plans

Academic yearProgrammeField of studySpec.FormStudy language Tut. centreYearWSType of duty
2019/2020 (P3942) Nanotechnology (3942V001) Nanotechnology P Czech Ostrava Choice-compulsory study plan
2019/2020 (P3942) Nanotechnology (3942V001) Nanotechnology K Czech Ostrava Choice-compulsory study plan
2019/2020 (P1701) Physics (1702V001) Applied Physics P Czech Ostrava Choice-compulsory study plan
2019/2020 (P1701) Physics (1702V001) Applied Physics K Czech Ostrava Choice-compulsory study plan
2018/2019 (P3942) Nanotechnology (3942V001) Nanotechnology K Czech Ostrava Choice-compulsory study plan
2018/2019 (P3942) Nanotechnology (3942V001) Nanotechnology P Czech Ostrava Choice-compulsory study plan
2018/2019 (P1701) Physics (1702V001) Applied Physics P Czech Ostrava Choice-compulsory study plan
2018/2019 (P1701) Physics (1702V001) Applied Physics K Czech Ostrava Choice-compulsory study plan

Occurrence in special blocks

Block nameAcademic yearForm of studyStudy language YearWSType of blockBlock owner