9360-0227/02 – Characterization methods of nanostructures (MCHN)

Gurantor departmentCNT - Nanotechnology CentreCredits10
Subject guarantordoc. Dr. Mgr. Kamil PostavaSubject version guarantordoc. Dr. Mgr. Kamil Postava
Study levelpostgraduateRequirementCompulsory
YearSemesterwinter + summer
Study languageEnglish
Year of introduction2020/2021Year of cancellation
Intended for the facultiesFMTIntended for study typesDoctoral
Instruction secured by
LoginNameTuitorTeacher giving lectures
PIS50 prof. Ing. Jaromír Pištora, CSc.
PLA88 prof. Ing. Daniela Plachá, Ph.D.
POS40 doc. Dr. Mgr. Kamil Postava
SIM75 doc. Ing. Gražyna Simha Martynková, Ph.D.
Extent of instruction for forms of study
Form of studyWay of compl.Extent
Full-time Examination 20+0
Part-time Examination 20+0

Subject aims expressed by acquired skills and competences

The main target of the subject is to obtain overview of characterization methods for study of nanostructures. Particular target is deep understanding and detail practicing of the characterization methods relating to the subject of thesis of the student.

Teaching methods

Lectures
Individual consultations
Experimental work in labs

Summary

The subject includes physical and chemical characterization methods for nanostructures, measurement principles, limits of different techniques, and specific applications. Focus of the subject will be chosen in agreement with specialization of the student and title of his thesis.

Compulsory literature:

S. Myhra, J. C. Rivière, Characterization of Nanostructures, CRC Press 2016 D.Brabazon and A.Raffer, Advanced Characterization Techniques for Nanostructures, In: Emerging Nanotechnologies for Manufacturing, Edited by: W. Ahmed and M. J. Jackson, William Andrew Publ. 2009 A. L. Da Róz, M. Ferreira, O. N. Oliveira, Jr., Nanocharacterization Techniques, 2017 S. T. Raju, T, Ajesh Z. R. Kumar, Microscopy Methods in Nanomaterials Characterization, Elsevier 2017 R. Haight, J. B Hannon, Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization, World Scientific 2011 E. Lundanes, L. Reubsaet, T. Greibrokk, Chromatography, basic Principles, Sample Preparations and Related Methods, J. Wiley and Sons, 2014

Recommended literature:

B. Bhushan (Ed.), Scanning Probe Microscopy in Nanoscience and Nanotechnology, Sprnger 2010 B. Voigtländer, Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (NanoScience and Technology), Springer 2015 S. Svanberg, Atomic and molecular spectroscopy: basic aspects and practical applications, Springer-Verlag, Berlin 1991 P. Griffiths, J. A. De Haseth, Fourier Transform Infrared Spectrometry (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications), Wiley 2nd. Ed, 2007 N. Yao, Z. L. Wang, Handbook of Microscopy for Nanotechnology (Nanostructure Science and TX‐Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniquesechnology), Springer 2005 J. Guo, X‐Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques, Willey 2010 M. F. Vitha, Chromatography: Principles and Instrumentation, J. Wiley and Sons, 2017

Way of continuous check of knowledge in the course of semester

oral exam

E-learning

Other requirements

The main target of the subject is to obtain overview of characterization methods for study of nanostructures. Particular target is deep understanding and detail practicing of the characterization methods relating to the subject of thesis of the student.

Prerequisities

Subject has no prerequisities.

Co-requisities

Subject has no co-requisities.

Subject syllabus:

1. Electron microscopy of nanostructures (sample preparation, Scanning Electron Microscopy, Transmission Electron Microscopy, special methods of electron microscopy) 2. Scanning probe microscopy (Atomic Force Microscopy, Magnetic Force Microscopy, Scanning Near-field Optical Microscopy, Scanning Tunelling Microscopy) 3. X-ray spectroscopy and diffraction (X-ray diffraction, X-ray Photoeelectron Spectroscopy, Energy Dispersive X-ray Spectroscopy) 4. Optical spectroscopy of nanostructures (ultraviolet, visible spektroscopy, photoluminiscence, Fourier Transform InfraRed spectroscopy, THz spectroscopy, Raman spektroscopy, Atomic Absorption Spectroscopy), Inductively Coupled Plasma Spectroscopy, Mass Spectroscopy, Nuclear Magnetic Resonance 5. Thermal analysis (Differential Thermal Analysis, Differential Scanning Calorimetry, Thermogravimetric analysis, simultaneous TG/DTA/DSC) 6. Measurement of size and shape of nanoparticles, and surface porosity (Laser diffraction, chromatography, Dynamic Light Scattering) 7. Organic analysis for nanostructure characterization (size exclusion chromatography, supercritical fluid, gas, liquid chromatography, mass detectors in chromatography, electromigration methods)

Conditions for subject completion

Full-time form (validity from: 2020/2021 Winter semester)
Task nameType of taskMax. number of points
(act. for subtasks)
Min. number of points
Examination Examination  
Mandatory attendence parzicipation:

Show history

Occurrence in study plans

Academic yearProgrammeField of studySpec.ZaměřeníFormStudy language Tut. centreYearWSType of duty
2021/2022 (P0719D270003) Nanotechnology P English Ostrava Compulsory study plan
2021/2022 (P0719D270003) Nanotechnology K English Ostrava Compulsory study plan
2020/2021 (P0719D270003) Nanotechnology P English Ostrava Compulsory study plan
2020/2021 (P0719D270003) Nanotechnology K English Ostrava Compulsory study plan

Occurrence in special blocks

Block nameAcademic yearForm of studyStudy language YearWSType of blockBlock owner