9360-0229/01 – Special Methods of Analytical Chemistry (SMACH)

Gurantor departmentCNT - Nanotechnology CentreCredits10
Subject guarantorprof. Ing. Jana Seidlerová, CSc.Subject version guarantorprof. Ing. Jana Seidlerová, CSc.
Study levelpostgraduateRequirementChoice-compulsory type B
YearSemesterwinter + summer
Study languageCzech
Year of introduction2019/2020Year of cancellation
Intended for the facultiesFMTIntended for study typesDoctoral
Instruction secured by
LoginNameTuitorTeacher giving lectures
SEI40 prof. Ing. Jana Seidlerová, CSc.
Extent of instruction for forms of study
Form of studyWay of compl.Extent
Full-time Examination 20+0
Part-time Examination 20+0

Subject aims expressed by acquired skills and competences

The aim of the course is focused on methods of inorganic analysis of nanomaterials. Particular attention will be paid to the selected spectral methods such as X-ray spectral analysis, absorption and emission methods in both ultraviolet and visible spectrum, methods used for chemical analysis of thin films and direct chemical analysis of micro/nano particles.

Teaching methods

Individual consultations
Project work

Summary

The course is focused on methods of inorganic analysis of nanomaterials. Particular attention will be paid to the selected spectral methods such as X-ray spectral analysis, absorption and emission methods in both ultraviolet and visible spectrum, methods used for chemical analysis of thin films and direct chemical analysis of micro/nano particles. The mentioned methods will be supplemented with an overview of modern sophisticated methods combinations such as electron microscope and the Raman spectroscopy, electon microscope and the X-ray or electron diffraction spectroscopy. Analytical chemistry utilising nanomaterials will be also introduced in a part of the course.

Compulsory literature:

Kenkel, J. Analytical Chemistry for Technicians, Third Edition, CRC 2002 SVANBERG, S. Atomic and molecular spectroscopy: basic aspects and practical applications. 4th rev. ed. Berlin: Springer, 2004. Advanced texts in physics. ISBN 3-540-20382-6 Tertian, R., Claisse, F. Priciples of Quantitative X-Ray Fluorescence Analysis, Hayden & son Ltd, London 1982

Recommended literature:

RAMACHANDRAN, V. S., BEAUDOIN, J. J. ed. Handbook of analytical techniques in concrete science and technology: principles, techniques, and applications. Park Ridge: Noyes Publications, 2001. Construction materials science and technology series. ISBN 0-8155-1437-9 SPENCE, J. C. H. High-resolution electron microscopy. 4th ed. Oxford: Oxford University Press, 2013. ISBN 978-0-19-966863-2

Way of continuous check of knowledge in the course of semester

Zpracování seminární práce na zadané téma v min rozsahu 5 stran formátu A4, ústní zkouška.

E-learning

Other requirements

Write a seminar work. Topic of the seminar work is defined by supervisor.

Prerequisities

Subject has no prerequisities.

Co-requisities

Subject has no co-requisities.

Subject syllabus:

1. Spectral methods of analytical chemistry Atomic emission spectrometry (excitation by spark, glow discharge, ICP), optical spectrometry, mass spectrometry Atomic absorption spectrometry (flame and electro thermal atomization, gaseous hydrides method) X-ray spectral analysis, X-ray fluorescence spectrometry (XRF), XRF with focused X-ray beam, total reflection method, grazing method Electron spectroscopy (XPS, AES) Molecular absorption analysis, UV/VIS spectrometry, infrared spectrometry, Raman spectrometry, Raman microscopy 2. Electrochemical methods Conductometry, conductometric titrations Potentiometry, ion selective electrodes, potentiometric titration Electrolytical methods, voltammetry (polarography), new voltammetric methods, coulometry Electromigration separation methods, capillary electrophoresis, isotachophoresis 3. Analytical electron microscopy (AEM) Basics of electron microscopy, interaction of electron beam with matter and basic components of electron microscopes Transmition electron microscopy (TEM), scanning electron microscopy (SEM), scanning transmition electron microscopy (STEM) X-ray spectral microanalysis, Auger electrons spectrometry Electron energy loss spectrometry (EELS) Focused ion beam (FIB), manipulation with sample in nano - scale

Conditions for subject completion

Part-time form (validity from: 2019/2020 Winter semester)
Task nameType of taskMax. number of points
(act. for subtasks)
Min. number of points
Examination Examination  
Mandatory attendence parzicipation:

Show history

Occurrence in study plans

Academic yearProgrammeField of studySpec.ZaměřeníFormStudy language Tut. centreYearWSType of duty
2021/2022 (P0719D270002) Nanotechnology P Czech Ostrava Choice-compulsory type B study plan
2021/2022 (P0719D270002) Nanotechnology K Czech Ostrava Choice-compulsory type B study plan
2020/2021 (P0719D270002) Nanotechnology K Czech Ostrava Choice-compulsory type B study plan
2020/2021 (P0719D270002) Nanotechnology P Czech Ostrava Choice-compulsory type B study plan

Occurrence in special blocks

Block nameAcademic yearForm of studyStudy language YearWSType of blockBlock owner