9360-0500/01 – Thin Films (TV)

Gurantor departmentCNT - Nanotechnology CenterCredits4
Subject guarantordoc. Dr. Mgr. Kamil PostavaSubject version guarantordoc. Dr. Mgr. Kamil Postava
Study levelundergraduate or graduate
Study languageCzech
Year of introduction2018/2019Year of cancellation
Intended for the facultiesUSP, HGFIntended for study typesBachelor
Instruction secured by
LoginNameTuitorTeacher giving lectures
POS40 doc. Dr. Mgr. Kamil Postava
Extent of instruction for forms of study
Form of studyWay of compl.Extent
Full-time Credit and Examination 2+2

Subject aims expressed by acquired skills and competences

Explain physical properties of thin films (optical, electric, and magnetic properties) Analyze the applications (for example antireflection coatings, thin film interference filters, etc.)

Teaching methods

Lectures
Tutorials

Summary

Předmět se zabývá fyzikálními vlastnostmi a aplikacemi tenkých vrstev. Pozornost je zaměřena na optické, elektrické a magnetické vlastnosti tenkých vrstev. Důraz je kladen na aplikační výstupy, např. antireflexní vrstvy, tenkovrstvé interferenční filtry, vrstvy využívané v polovodičovém průmyslu a informačních technologiích.

Compulsory literature:

OHRING, M., The material science of thin films, Academic Press, 1992. MACLEOD, H. A.: Thin-film optical filters, 2nd ed. Bristol, 1986; YEH, P.: Optical waves in layered media, Willey, New York 1988;

Recommended literature:

LUTH, H., Solid surfaces, interfaces and thin films, Springer, Berlin 2001. AZZAM, R. M. A., BASHARA, N. M.: Ellipsometry and polarized light, North-Holland, Amsterdam, 1977;

Way of continuous check of knowledge in the course of semester

E-learning

Další požadavky na studenta

Systematic off-class preparation.

Prerequisities

Subject has no prerequisities.

Co-requisities

Subject has no co-requisities.

Subject syllabus:

Contents: - Introduction to methods of thin film preparation and characterization. - Optics of thin films - electromagnetic theory of light propagation in thin and thick layers, phenomena at interfaces, matrix description of isotropic and anisotropic layered media - Optical multilayer filters - anti-reflection systems, bandpass filters, thin-film beamsplitters, narrow-band pass Fabry-Perot filters. - Electrical properties of thin films - conductivity of thin layers, transport phenomena, thin films of semiconductors and dielectrics, semiconductors and semiconductor and metal interfaces. - Application of thin layers in semiconductor industry and technology ultra-high integration, measurement of electrical parameters of thin layers. - Magnetic properties of thin films - ferromagnetic thin films, magnetic anisotropy, applications in magnetic recording and sensors.

Conditions for subject completion

Full-time form (validity from: 2018/2019 Winter semester)
Task nameType of taskMax. number of points
(act. for subtasks)
Min. number of points
Credit and Examination Credit and Examination 100  51
        Credit Credit  
        Examination Examination  
Mandatory attendence parzicipation:

Show history

Occurrence in study plans

Academic yearProgrammeField of studySpec.FormStudy language Tut. centreYearWSType of duty
2019/2020 (B3942) Nanotechnology (3942R001) Nanotechnology P Czech Ostrava 3 Choice-compulsory study plan
2018/2019 (B3942) Nanotechnology (3942R001) Nanotechnology P Czech Ostrava 3 Choice-compulsory study plan
2018/2019 (B1701) Physics (1702R001) Applied Physics P Czech Ostrava 3 Choice-compulsory study plan

Occurrence in special blocks

Block nameAcademic yearForm of studyStudy language YearWSType of blockBlock owner